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Electrostatic attenuation time testing device

A decay time, testing device technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc.

Inactive Publication Date: 2012-07-11
PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The object of the present invention is to provide static decay time testing device, which is used to solve the problem of decay time testing of static dissipative materials

Method used

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Embodiment Construction

[0016] figure 1 It is the schematic diagram of charge-discharge control circuit when testing samples: 1-vacuum high-voltage switch 1; 2-vacuum high-voltage switch 2; 3-electrode and sample fixture; 4-sample schematic diagram; 5-low voltage control charge-discharge switch.

[0017] figure 2 It is a non-contact active sensor electrical schematic diagram: C 0 Indicates the equivalent capacitance of the input probe to the ground; A1 is the emitter follower, A2 is the non-inverting amplifier; R 1 >1GΩ, R 2 >3MΩ, used for zero drift suppression; the circuit is also equipped with zero adjustment and zero reset buttons, which are used to reset the circuit before testing.

[0018] image 3 It is the principle block diagram of the decay time timing device of the present invention: the discharge control signal is used as the trigger signal to make the single chip microcomputer start counting, and the time is displayed by the LED; at the same time, the decay voltage on the sample is ...

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Abstract

The invention discloses an electrostatic attenuation time testing device, which can be used for testing a thermally-sealable flexible electrostatic dissipation material sample (including a plate type sample). In the device, a non-contact active detection sensor is adopted, the sample is charged under the voltage of + / -5kV, time consumed by attenuation of the testing voltage to + / -100V is displayed by an LED (Light-Emitting Diode), and the clock error is superior to 5 percent.

Description

technical field [0001] The present invention is a device for testing the decay time of static dissipative materials. The device is used for the static decay time test of heat-sealable flexible static dissipative material samples (including plate samples). Background technique [0002] With the widespread use of microelectronics technology in electronic products and equipment, the electrostatic sensitivity of these products is getting higher and higher. As the carrier and protector of electronic products and equipment, the electrostatic properties of packaging materials directly affect the performance of the packaged products. Therefore, in order to make packaging materials meet the requirements of use or meet the requirements of standards, it is necessary to test their electrostatic properties. [0003] Static decay time is one of the important indicators to measure the antistatic ability of packaging materials (heat-sealable and flexible barrier materials). At present, t...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 刘存礼武占成王书平孙永卫李宇明张希军杨洁原青云
Owner PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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