Positive and negative strip-shaped phase diaphragm, 4f phase-coherent nonlinear imaging system employing same and nonlinear refractivity measurement method

A technology of nonlinear imaging and phase aperture, applied in the field of optics, can solve the problems of low measurement accuracy and difficulty

Inactive Publication Date: 2012-10-03
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The object of the present invention is to provide a positive and negative strip-shaped phase diaphragm and a 4f phase coherent nonlinear imaging system using the diaphragm and the nonlinear refraction rate measurement method

Method used

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  • Positive and negative strip-shaped phase diaphragm, 4f phase-coherent nonlinear imaging system employing same and nonlinear refractivity measurement method
  • Positive and negative strip-shaped phase diaphragm, 4f phase-coherent nonlinear imaging system employing same and nonlinear refractivity measurement method
  • Positive and negative strip-shaped phase diaphragm, 4f phase-coherent nonlinear imaging system employing same and nonlinear refractivity measurement method

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specific Embodiment approach 1

[0056] Specific implementation mode one: the following combination figure 2 Describe this embodiment. This embodiment is a positive and negative strip phase diaphragm. The phase delays of the positive and negative strip phase objects in the center of the phase diaphragm are respectively 2mπ+π / 2 and 2nπ-π / 2, where m, n is an integer.

specific Embodiment approach 2

[0057] Specific implementation mode two: the following combination figure 2 Describe this embodiment. This embodiment is a further description of the positive and negative strip phase diaphragms described in Embodiment 1. The positive and negative strip phase diaphragms described in this embodiment pass through a circular diaphragm. A strip-shaped phase object formed by coating a transparent dielectric film, the beam passing through the phase object is delayed by ±π / 2 in phase compared with the beams of other parts.

specific Embodiment approach 3

[0058] Specific implementation mode three: the following combination image 3 This embodiment is described. The difference between this embodiment and Embodiment 1 is that the 4f phase coherent nonlinear imaging system of the positive and negative strip phase apertures includes a measurement system and an energy reference system;

[0059] The measurement system is composed of a half-wave plate 1, a polarizing prism 2, a beam expander 3, a positive and negative strip phase diaphragm 4, a beam splitter 5, a convex lens 6, a convex lens 8, and a neutral lens An attenuation sheet 9 and an image sensor 10 are formed;

[0060] Half-wave plate 1, polarizing prism 2, beam expander 3, positive and negative strip phase diaphragm 4, beam splitter 5, convex lens No. 6, nonlinear sample to be measured 7, convex lens No. 2 8 and No. 1 Neutral attenuation sheets 9 are sequentially placed on the optical axis of incident light, and the light beam attenuated by No. 1 neutral attenuation sheet ...

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Abstract

The invention provides a positive and negative strip-shaped phase diaphragm, a 4f phase-coherent nonlinear imaging system employing the same and a nonlinear refractivity measurement method, relates to a 4f phase-coherent nonlinear imaging system of a phase diaphragm and a nonlinear refractivity measurement method, which belong to the optical field, and aims to solve the problems that a traditional phase diaphragm has difficult manufacture process and low measuring accuracy. The phase delays of a positive strip-shaped phase object and a negative strip-shaped phase object of the positive and negative strip-shaped phase diaphragm are respectively 2m Pi+Pi / 2 and 2n Pi-Pi / 2, wherein m and n are integral numbers. The 4f phase-coherent nonlinear imaging system employing the positive and the negative strip-shaped phase diaphragm comprises a measurement system and an energy reference system; and the method is used for measuring the nonlinear refractivity.

Description

technical field [0001] The invention relates to a 4f phase coherent nonlinear imaging system of a phase diaphragm and a method for measuring the nonlinear refractive index, belonging to the field of optics. Background technique [0002] The Z-scan method requires the axial movement of the nonlinear sample, and the requirements for optical path adjustment are high. In addition, due to the nature of its multi-pulse irradiation, it has high requirements on the stability of laser pulses in time, space, and energy, otherwise it will cause large measurement errors. Not only that, the continuous high-intensity irradiation near the focal point of the Z-scan system will cause irreversible damage to nonlinear samples, which limits the scope of its application objects. Although the 4f phase coherent nonlinear imaging technology uses the phase diaphragm to realize the simultaneous measurement of the magnitude and sign of the nonlinear refractive index, the manufacture of the circular p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B5/30G02B27/28G01N21/41
Inventor 石光宋瑛林聂仲泉李中国杨昆王玉晓张学如
Owner HARBIN INST OF TECH
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