Large-area-friction-induced micron-scale processing equipment in multipoint contact mode
A multi-point contact and friction-induced technology, applied in scanning probe microscopy, measuring devices, instruments, etc., can solve the problems of slow processing speed, limited processing efficiency, low efficiency, etc., and achieve uniform convex structure of thin slices, processing Efficiency improvement and low processing cost
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[0036] figure 1 It is shown that a specific embodiment of the present invention is a large-area friction-induced micron-scale processing equipment in a multi-point contact mode, which is composed of a base 12, a processing platform driving device on the base 12, and a processing platform on the base 12. The loading mechanism and the data acquisition and control system are composed of:
[0037] The structure of the processing platform driving device is as follows: the horizontal two-dimensional electric control translation stage 1 is fixed on the upper surface of the base 12 by bolts, and the bottom plate of the manual three-dimensional displacement stage 3 is fixed on the horizontal two-dimensional electric control translation stage through the connecting plate 2. The upper surface of 1; the vertical plate of the manual three-dimensional displacement stage 3 is fixedly connected with the vertical plate of the "L"-shaped sample stage 4;
[0038] The configuration of the loadin...
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