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DDS (data-data short) detection structure and DDS detection method

A technology for detecting structures and on-off switches, applied in nonlinear optics, instruments, optics, etc., can solve problems such as increased analysis time, inability to DDS classification, and inability to more effectively and timely confirm the cause of defects, so as to improve product yield. Effect

Active Publication Date: 2012-11-07
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the circuit test through the short-circuit bar is only a very general test, and the DDS cannot be classified, which makes the subsequent analysis process very cumbersome, increases the analysis time, and cannot confirm the cause of the defect in a more effective and timely manner, thereby improving the yield rate.

Method used

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  • DDS (data-data short) detection structure and DDS detection method
  • DDS (data-data short) detection structure and DDS detection method

Examples

Experimental program
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Effect test

Embodiment 2

[0034] like figure 2 As shown, this embodiment is an extension of Embodiment 1. In this embodiment, the on-off switch is a thin film field effect transistor (TFT) switch TFT, and the detection structure further includes controlling the thin film field effect transistor. The control line that switches the TFT on and off.

[0035] In this embodiment, the control lines and the gate lines on the display panel are fabricated in the same layer.

[0036] The detection structure is provided with at least N control lines, where N is greater than or equal to 3 and less than or equal to the total number of data lines; the thin-film field effect transistor switching TFTs on each of the N data lines arranged in sequence are controlled by different control lines respectively.

[0037] like figure 2 As shown, there are three control lines in this embodiment, which are a first control line G1 , a second control line G2 and a third control line G3 respectively. Depend on figure 2 It can...

Embodiment 3

[0039] like image 3 As shown, this embodiment records a method for DDS detection using the DDS detection structure described in Embodiment 1 or Embodiment 2, including the following steps:

[0040] S1: Input a high potential to one of the odd-numbered voltage input terminal and the even-numbered voltage input terminal, and input a low potential to the other; turn off all on-off switches, so that the circuit in the display panel is disconnected from the data line of the peripheral circuit; if there is a signal If the output from the main circuit line with low potential input means that the peripheral circuit is abnormal, the data line is short-circuited, and the detection is over; if there is no signal output from the main circuit line with low potential input, it means that there is no problem with the peripheral circuit, and go to step S2;

[0041]S2: Input a high potential to one of the odd-numbered voltage input terminal and the even-numbered voltage input terminal, and in...

Embodiment 4

[0044] The present embodiment is an example extended on the basis of the third embodiment, specifically when the DDS detection structure recorded in the second embodiment is used for DDS detection:

[0045] First, a high potential is input to the odd-numbered voltage input terminal of the odd-numbered main circuit line DO, and a low potential is input to the odd-numbered voltage input terminal of the even-numbered main circuit line DE, and at this time, the first control line G1, the second control line G2 and the third control line G3 all input low voltage, that is, the TFT switches on all data lines are turned off at this time. If there is a signal output from the even-numbered bus line DE, it means that there is SD metal in the peripheral circuit (the metal of the data line). material) remains, causing two adjacent data lines to conduct, resulting in a short circuit. If no signal is output from the even-numbered total circuit line DE, it means that there is no problem with t...

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Abstract

The invention discloses a DDS (data-data short) detection structure which comprises a display panel, an odd main circuit line and an even main circuit line. A plurality of data lines are sequentially arranged in a peripheral circuit, each two adjacent data lines comprise an odd line and an even line, the odd main circuit line is connected with all odd lines of the data lines and provided with an odd voltage input end, the even main circuit line is connected with all even lines of the data lines and provided with an even voltage input end, and each data line in the peripheral circuit of the display panel is provided with an on-off switch. The invention further discloses a method of using the DDS detection structure for DDS detection. By the DDS detection structure and the DDS detection method, DDS occurrence position range and DDS type searching range can be narrowed as soon as possible, and accordingly DDS occurrence reasons can be found more quickly and more accurately to increase product yield.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display device detection, and in particular, to a DDS detection structure and a detection method. Background technique [0002] At present, in the production line test of thin film field effect transistor liquid crystal display (TFT-LCD) industrial array (Array), it is necessary to detect data line open circuit (Data Open), DDS (data line-data line short circuit Data-Data Short), etc. The main method is: in the peripheral circuit, connect the odd-numbered lines of all data lines (Data lines) into an odd-numbered total circuit line DO through a shorting bar, and connect all the even-numbered lines through a shorting bar in the peripheral circuit. The even-numbered main circuit line DE; when different voltages are applied to the odd-numbered main circuit line DO and the even-numbered main circuit line DE, if there is no short circuit, the current flows smoothly, and if a short circuit occurs ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00
CPCG02F2001/136254G09G3/006G09G2310/0275G09G3/36G02F1/133G09G3/00G09G2330/12G02F1/136254
Inventor 贾丕健郝昭慧
Owner BOE TECH GRP CO LTD
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