Dynamic strain measurement instrument based on multiple overlapped gratings
A dynamic strain and measuring instrument technology, applied in the field of sensing, can solve the problems affecting the multiplexing ability and demodulation accuracy of the demodulation system, and the limitation of tunable speed, so as to improve the application range and flexibility, improve the measurement bandwidth and wavelength high resolution effects
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[0039] The following mainly illustrates the measurement method of a dynamic sinusoidal strain signal that is 4 times faster than the scan rate of a tunable filter by overlapping multiple gratings with two sensing gratings written on top of each other. figure 2 The demodulation principle of the dynamic strain gauge based on overlapping multi-gratings is given. Taking the wavelength scanning range of the tunable filter from 1535nm to 1555nm as an example, the central wavelength of the two sensing gratings in the overlapping multi-gratings can be calculated according to the formula (1 ) for selection, corresponding to the center wavelengths of the two sensor gratings are 1540nm and 1550nm respectively, the center wavelength interval of each sensor grating is 10nm, taking the wavelength scanning rate of the tunable filter as 500Hz as an example, the overlapping multi-grating design is adopted The dynamic strain sensing device can obtain the measured physical quantity of the same s...
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