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Integrated circuit testing system and control method for same

A test system and integrated circuit technology, applied in electronic circuit testing, electrical program control, program control in sequence/logic controllers, etc., can solve problems such as electrical loss, limited wiring ports of testers, and increased wiring difficulty , to avoid attenuation errors, avoid wiring difficulties, and save test costs

Inactive Publication Date: 2013-01-02
成都市中州半导体科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The above-mentioned test system uses flat cables in communication. The advantage is that the cost is low, but there are also disadvantages. Specifically, each tester adopts a serial test process and can only be connected to a single probe station, robotic arm or test load board. ; and due to the limited cable opening of the tester, it is not possible to use multiple parallel tests for chips with many pins; because the cable is generally short in length due to the electrical loss of the cable, the tester is generally close to the probe station and other equipment Placement is not conducive to space management, increases the difficulty of wiring, and cannot realize remote control

Method used

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  • Integrated circuit testing system and control method for same
  • Integrated circuit testing system and control method for same
  • Integrated circuit testing system and control method for same

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Embodiment Construction

[0021] see image 3 , the integrated circuit testing system preferred embodiment of the present invention comprises a control device, a tester with a GPRS module connected to the control device, a load board array with a GPRS module connected with the tester with a GPRS module, a A robotic arm array connected to the load board array with the GPRS module, a chip array connected to the robotic arm array, the load board array with the GPRS module includes N load boards with the GPRS module, and the robotic arm array includes N mechanical arms, and the chip array includes N chips, where N≥1.

[0022] A first GPRS module driver is installed in the tester main control chip of the tester with the GPRS module, which is used to control the work of the GPRS module of the tester with the GPRS module; the load board with the GPRS module has a built-in load board master control chip, and a second GPRS module driver is installed in the main control chip of the load board to control the wor...

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Abstract

The invention discloses an integrated circuit testing system which comprises control equipment, a tester, a load plate, an automatic test machine and a tested device. The tester is connected with the control equipment, the load plate is connected with the tester, the automatic test machine is connected with the load plate, and the tested device is connected with the automatic test machine. The invention further discloses a control method for the integrated circuit testing system. The integrated circuit testing system and the control method have the advantages that problems in the aspect of wire arrangement between the tester and the test load plate are solved, testing cost is lowered, and testing efficiency and accuracy of outputted testing results are improved.

Description

technical field [0001] The invention relates to integrated circuit testing technology, in particular to a wireless communication module-based integrated circuit test system and a control method based on the wireless communication module integrated circuit test system. Background technique [0002] The current traditional integrated circuit test is divided into two types: mid-test and final test. The test systems are relatively similar. Both use the tester to receive the test vector code, and control the probe station or the mechanical arm to move the test load board to contact the chip Die on the wafer. Or the finished packaged chip is tested and the test result is received. The connection between the tester and the probe station, the manipulator and the test load board are all connected by cables. [0003] The above-mentioned test system uses flat cables in communication. The advantage is that the cost is low, but there are also disadvantages. Specifically, each tester adop...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G05B19/04
Inventor 徐正元
Owner 成都市中州半导体科技有限公司
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