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Full-automatic, multi-parameter, wide-range and low-cost radio link control (RLC) testing device

A test device and multi-parameter technology, applied in the field of RLC test, can solve the problems of unsatisfactory test inductance, complex circuit, single function, etc., and achieve the effect of improving the range and test accuracy, simple circuit structure and low cost

Inactive Publication Date: 2013-01-30
ZHEJIANG IND & TRADE VACATIONAL COLLEGE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] 1) The bridge method has the highest precision, but the circuit is complicated and it is difficult to automatically test the full range
[0004] 2) The resonance method has high measurement accuracy, but the circuit is complicated and it is difficult to automatically test the full range
[0005] 3) The frequency sweep method has high precision, but the circuit is complicated, and it is difficult to automatically test the full range
[0006] 4) Voltammetry (i.e. V-I method), the circuit is simple, and it is difficult to automatically test the full range, but the test inductance is not ideal
However, the traditional multimeter has a single function and is not cost-effective.

Method used

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  • Full-automatic, multi-parameter, wide-range and low-cost radio link control (RLC) testing device

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Embodiment Construction

[0023] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0024] Such as figure 1 As shown, the present invention provides a fully automatic multi-parameter wide-range low-cost RLC testing device, including a single-chip microcomputer and a plurality of voltage dividing resistors with different resistance values, and the first socket for accessing the RLC device to be tested and the second socket; the multiple voltage dividing resistors are respectively connected to a plurality of IO ports of the microcontroller; the other ends of the multiple voltage dividing resistors are connected together and connected to the positive pole of the diode D1, and the negative pole of the diode D1 is connected to the capacitor C1; The first socket is connected to the anode of the diode D1, and the second socket is grounded. In this embodiment, the number of voltage dividing resistors is preferably 8, that i...

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Abstract

The invention provides a full-automatic, multi-parameter, wide-range and low-cost radio link control (RLC) testing device which comprises a singlechip, a plurality of differential voltage resistors with different resistance values, and a first socket and a second socket connected to an RLC device to be detected. The plurality of differential voltage resistors are respectively connected with a plurality of input / output (IO) ports of the singlechip; the other ends of the differential voltage resistors are connected together and then connected with the anode of a diode D1, and the cathode of the diode D1 is connected with a capacitor C1; and the first socket is connected with the anode of the diode D1, and the second socket is grounded. The RLC testing device only consists of a plurality of resistors (R0-R7), the diode (D1), the capacitor (C1) and the singlechip, so the circuit structure is very simple and the cost is low; and by using the high-resistance property of IO pins of the singlechip, a plurality of (eight) resistors can generate many (256) combinations, so that the low cost is ensured, and the ranges of resistance test and capacitance test are greatly improved. The RLC testing device can be used as a module of a universal meter.

Description

technical field [0001] The invention belongs to the field of RLC testing, and in particular relates to a fully automatic multi-parameter, wide-range and low-cost RLC testing device. Background technique [0002] In the composition of electronic systems, in addition to functional components such as microcomputer ASICs, independent RLC components are generally required. The quality of RLC components is an important factor in determining the performance of electronic systems. RLC parameter test is the most basic parameter test in the electronics industry. RLC test technology is already a fairly mature technology. There are many test methods, each with its own advantages and disadvantages. The advantages and disadvantages of the main methods are as follows: [0003] 1) The bridge method has the highest precision, but the circuit is complicated and it is difficult to automatically test the full range. [0004] 2) The resonance method has high measurement accuracy, but the circ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R15/12
Inventor 王建平
Owner ZHEJIANG IND & TRADE VACATIONAL COLLEGE