Time-of-flight mass spectrometer with accumulating electron impact ion source

A technology of time-of-flight mass spectrometry and time-of-flight, which is applied to time-of-flight spectrometers, mass spectrometers, ion sources/guns, etc., and can solve the problems of distorted fragment intensity ratio and slow spectrum acquisition.

Inactive Publication Date: 2013-04-24
LECO CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because EI spectra are multi-peaked, scanning mass analyzers often have to be used over a wide mass range, which leads to unavoidable ion losses on quadrupole mass spectrometer

Method used

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  • Time-of-flight mass spectrometer with accumulating electron impact ion source
  • Time-of-flight mass spectrometer with accumulating electron impact ion source
  • Time-of-flight mass spectrometer with accumulating electron impact ion source

Examples

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Embodiment Construction

[0022] figure 1 A schematic diagram of an exemplary time-of-flight (TOF) mass spectrometer system 10 employing orthogonal acceleration combined with ion accumulation within an electron impact (EI) ionization source is provided. TOF mass spectrometer system 10 includes accumulated electron impact ion source assembly 50 in communication with ion mirror 160 and detector 180 . Accumulated electron impact ion source assembly 50 includes accumulated ion source 100 in communication with ion transfer optics 120 and orthogonal accelerator 140 . Accumulated ion source 100 defines a first X-axis and a second Y-axis perpendicular to the X-axis. In some embodiments, accumulated ion source 100 includes an electron emitter 102 (eg, a thermal emitter) that delivers a continuous beam of electrons 104 into an ionization space 115 defined between first and second electrodes 108a and 108b, the The first and second electrodes are connected to respective first and second pulse generators 110a, 11...

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Abstract

An accumulating ion source for a mass spectrometer that includes a sample injector (328) introducing sample vapors into an ionization space (115) and an electron emitter (102) emitting a continuous electron beam (104) into the ionization space (115) to generate analyte ions. The accumulating ion source further includes first and second electrodes (108a, 108b) arranged spaced apart in the ionization space (115) for accumulating analyte ions substantially therebetween. The first and second electrodes (108a, 108b) receive periodic extraction energy potentials to accelerate packets of analyte ions from the ionization space (115) along a first axis. An orthogonal accelerator (140) receives the packets of analyte ions along the first axis and periodically accelerates the packets of analyte ions along a second axis substantially orthogonal to the first axis.; A time delay between the extraction acceleration and the acceleration of each respective packet of analyte ions provides a proportional mass range of the respective packet of analyte ions.

Description

Background technique [0001] Electron impact (EI) ionization is widely employed in mass spectrometry for environmental analysis and technical control. Extract samples of interest from the medium being analyzed, such as food, soil or water. Extracts include analytes of interest within a rich chemical matrix. Separate extracts in time within 1D or 2D gas chromatography analysis (GC or GCxGC). A GC carrier gas (usually helium) carries the sample into an EI source for ionization with an electron beam. The electron energy is usually kept at 70eV in order to obtain standard fragment spectra. Spectra are collected using a mass spectrometer and then submitted for comparison to a library of standard EI spectra to identify analytes of interest. [0002] Many applications require high sensitivity (e.g. at least below 1 pg and preferably at 1 fg level) and with a high concentration dynamic range (e.g. at least 1E+5, desirably 1E+8) between low level analytes and rich chemical matrices ...

Claims

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Application Information

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IPC IPC(8): H01J49/40H01J49/14
CPCH01J49/147H01J49/401H01J49/0031
Inventor A·N·韦列奇科夫Y·哈辛
Owner LECO CORPORATION
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