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Full automatic crystalline grain detection and sorting all-in-one machine

A fully automatic and sorting technology, applied in sorting and other directions, can solve the problems of limited storage capacity of inspection machines and sorting machines, inability to share resources, and time-consuming problems

Inactive Publication Date: 2014-09-03
广东志成华科光电设备有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are at least the following problems in the above-mentioned prior art: most of the inspection machines are manually loaded, which affects production efficiency
After the inspection by the detector is completed, the detection disk needs to be installed on the disk, and then put into the cassette to be sorted by the sorter. The manual process in the middle is time-consuming and the integration is poor; The storage capacity of each material library is limited, and resource sharing cannot be realized

Method used

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  • Full automatic crystalline grain detection and sorting all-in-one machine
  • Full automatic crystalline grain detection and sorting all-in-one machine
  • Full automatic crystalline grain detection and sorting all-in-one machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0058] One of the specific implementations of a fully automatic grain detection and sorting integrated equipment of the present application includes an organism platform 100, and the organism platform 100 is provided with:

[0059] The three workbenches are wafer workbench 110, sorting workbench 120 and detection workbench 180 respectively. Used to carry discs for grain detection;

[0060] Swing arm mechanism 160, through which the discs on the wafer workbench 110 and the discs on the sorting workbench 120 are sorted;

[0061] Chip sorting material warehouse 170, which is used to store the cassettes loaded with discs; the cassette in this chip sorting material warehouse 170 has versatility, can be used to store sorting discs, and can also be used to store discs to be sorted. selected or the disk to be detected;

[0062] The transport conveyor system 130, which can move along the X-axis, Y-axis and Z-axis directions, the transport conveyor system 130 has two buffer positions,...

Embodiment 2

[0075] The second specific implementation mode of a fully automatic grain detection and sorting integrated equipment of the present application, the main technical solution of this embodiment is the same as that of embodiment 1, and the features not explained in this embodiment are adopted in embodiment 1 explanation, and will not repeat them here.

[0076] The difference between this embodiment and Embodiment 1 is that the transportation delivery system 130 includes:

[0077] An X-axis guide rail 400, an X-axis base 402, and an X-axis driving device 401 that drives the X-axis base 402 to reciprocate along the X-axis guide rail 400;

[0078] A Y-axis guide rail 500, a Y-axis base 502, and a Y-axis drive device 501 that drives the Y-axis base 502 to reciprocate along the Y-axis guide rail 500;

[0079] The Z-axis guide rail 600, the Z-axis base 602, and the Z-axis driving device 601 that drives the Z-axis base 602 to reciprocate along the Z-axis guide rail 600, and the Z-axis ...

Embodiment 3

[0086] The third specific implementation mode of a fully automatic grain detection and sorting integrated equipment of the present application, the main technical solution of this embodiment is the same as that of embodiment 1, and the features not explained in this embodiment are adopted in embodiment 1 explanation, and will not repeat them here.

[0087] The difference between this embodiment and Embodiment 1 is that the push device includes:

[0088] fixed bracket 1;

[0089] The transfer driving device 2 is used to transfer the transferred disk from the workbench to the transport delivery system 130 or back to the workbench from the transport delivery system 130. The transfer drive device 2 includes a The mounting seat 21, the transfer screw 22 arranged on the mounting seat 21, the motor driving the transfer screw 22 to rotate, and the sliding seat 23 screwed to the transfer screw 22;

[0090] Clamp mechanism 4, which is used to clamp the disc or loosen the disc, the cla...

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Abstract

This application discloses a fully automatic grain detection and sorting integrated equipment. The equipment consists of a wafer workbench, a sorting workbench, a detection workbench, a transportation system, a wafer workbench pushing device, and a sorting workbench pushing device. , testing workbench pushing device, swing arm mechanism, and chip sorting material warehouse, the above-mentioned nine main parts are composed. This application improves the traditional layout and mechanical structure in the prior art. Through the transport transmission system and the push device, the discs can be freely moved in and out between the workbench and the chip sorting warehouse, and the corresponding discs can be picked and placed synchronously. At the same time, the transport transmission system has two buffer positions, which can reduce the exchange time between the disks to be sorted and the disks after sorting, and the disks to be inspected and the disks after inspection. , thereby speeding up the time and efficiency of grain sorting and inspection. It has the characteristics of high-efficiency chip replacement, compact machine, compact structure, good machine stability, and good expandability of the chip sorting warehouse.

Description

technical field [0001] The present application relates to the technical field of grain sorting, in particular to a fully automatic grain detection and sorting integrated equipment. Background technique [0002] After light-emitting diodes (Light Emitting Diode, LED) and semiconductor wafers are cut into grains, a device with grain sorting function, such as a grain sorter, will be used to perform grain testing and binning. In the case of LEDs, several key parameters such as the main wavelength (peak length), luminous intensity (MCD), luminous flux (lumens), color temperature (color temperature), operating voltage (Vf), and reverse breakdown voltage (ImA) are usually targeted. For testing and sorting, this step has a significant impact on the die production and packaging costs of LEDs. Semiconductor grains can also be inspected and sorted according to product requirements. [0003] During the sorting process of the LED dies placed in the wafer ring, the die sorter will autom...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/00
Inventor 李斌吴涛朱国文龚时华朱文凯贺松平吴磊宋宪振汤瑞尹旭生库卫东
Owner 广东志成华科光电设备有限公司
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