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Power semiconductor device drive circuit

A technology for power semiconductors and driving circuits, applied in semiconductor devices, circuits, transistors, etc., to solve problems such as reduced high-speed switching performance

Inactive Publication Date: 2016-01-13
DENSO CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For this reason, if parasitic capacitance is added to the gate, it will degrade the high-speed switching performance

Method used

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  • Power semiconductor device drive circuit

Examples

Experimental program
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no. 1 example )

[0024] The first embodiment of the power semiconductor device driving circuit is configured as figure 1 shown. The voltage at the control terminal 1a of the power semiconductor device 1 formed by semiconductor switching devices is controlled to control the current flowing between the first terminal 1b and the second terminal 1c. The first terminal 1b and the second terminal 1c are a high-side terminal and a low-side terminal of the power semiconductor device 1, respectively. Thus, the current supplied to the load 2 , which is connected to the first terminal 1 b of the power semiconductor device 1 , is controlled. Although the load 2 is exemplified as being connected to the first terminal 1b, ie, the high potential side, of the power semiconductor device 1, it may also be connected to the second terminal 1c, ie, the low potential side. The power semiconductor device 1 is exemplified by a MOSFET. In case the power semiconductor device 1 is a MOSFET, the control terminal 1a, ...

no. 2 example )

[0041] The second embodiment of the power semiconductor device driving circuit is configured as image 3 shown. The second embodiment differs from the first embodiment in setting the position of the gate control terminal 5 and changing the configuration of the gate drive circuit 4 . With respect to other components, the second embodiment is the same as the first embodiment, so different components will be described.

[0042] Such as image 3 As shown, a gate control terminal 5 is provided in the gate drive circuit 4 , and a voltage holding circuit 10 , a logic circuit 11 , and three switches (SW) 12 to 14 are provided in the gate drive circuit 4 . Furthermore, an auxiliary power supply 15 is connected to the gate drive circuit 4 . The voltage holding circuit 10, the switch 13, the auxiliary power supply 15 and the like form a gate charging circuit. The resistor 6 and Zener diode 7 provided in the first embodiment are omitted.

[0043] The voltage holding circuit 10 is con...

no. 3 example )

[0058] The third embodiment of the power semiconductor device driving circuit is configured as Figure 5 shown in . The third embodiment is the first embodiment ( figure 1 ) and the second embodiment ( image 3 )The combination. Since the basic configuration is the same as that of the first and second embodiments, only the differences from the first and second embodiments will be described.

[0059] Such as Figure 5 As shown, the gate control terminal 5 and Zener diode 7 are provided in the same manner as in the first embodiment. In addition, a gate control terminal 5 is also provided for the gate drive circuit 4 . In addition, the voltage holding circuit 10, the logic circuit 11, the first switch 12 to the third switch 14, and the auxiliary power supply 15 are provided in the same manner as the second embodiment. Although the gate control terminal 5 connected to the resistor 6 and the gate control terminal 5 connected to the gate drive circuit 4 are shown as being pro...

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PUM

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Abstract

A power semiconductor device driving circuit includes a gate control terminal, which is provided at a position separated from a drain terminal of a power semiconductor device by a predetermined distance so that electric discharge is generated between the drain terminal and the gate control terminal at the time of generation of surge. A surge voltage is applied to the gate control terminal due to this discharge, the gate of the power semiconductor device is charged to turn on and absorb the surge energy. Thus it becomes possible to suppress the surge voltage applied to the drain terminal and prevent breakdown of the power semiconductor device.

Description

technical field [0001] The present invention relates to a power semiconductor device driving circuit for driving a power semiconductor device (semiconductor switching device), which switches a current supply to a load. Background technique [0002] In a power semiconductor device, when it is turned off in switching operation, due to inductive (L) load and noise, at the drain and source of the power semiconductor device, that is, in the drain-source path of the power semiconductor device A surge voltage (overvoltage) greater than the withstand voltage is generated. This surge voltage sometimes causes breakdown of power semiconductor devices. Conventional power semiconductor devices are generally made of silicon (Si) and the withstand voltage of such power semiconductor devices is limited by the performance or limited characteristics of the silicon material itself. As an alternative, consider wide bandgap semiconductor devices exemplified by gallium nitride (GaN). GaN semic...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03K17/08
CPCH03K17/0822H03K17/08H03K2217/0027H03K2217/0045
Inventor 小林敦高须久志
Owner DENSO CORP