Scanning sampling and image processing method of fast imaging

An image processing and image processing device technology, applied in the field of optical scanning, can solve the problems of weak image signal intensity, image detail distortion, short exposure time, etc., and achieve the effects of fast readout speed, low distortion, and high signal-to-noise ratio

An image processing and image processing device technology, applied in the field of optical scanning, can solve the problems of weak image signal intensity, image detail distortion, short exposure time, etc., and achieve the effects of fast readout speed, low distortion, and high signal-to-noise ratio

CN103179331AInactive Publication Date: 2013-06-26HUAZHONG UNIV OF SCI & TECH

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  • Scanning sampling and image processing method of fast imaging
  • Scanning sampling and image processing method of fast imaging
  • Scanning sampling and image processing method of fast imaging

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Embodiment Construction

[0024] In this specific embodiment, aiming at the high-speed imaging working mode of the new detection device sCMOS Flash2.8, a scanning sampling and image processing method based on image shift and superposition is firstly proposed to solve the problem of rapid continuous scanning and sampling of imaging objects based on platform movement. Problems with weak signal strength and low resolution in imaging.

[0025] Such as figure 1 The schematic diagram of the scanning sampling system is shown, and the imaging object is placed on the translation stage. During the scanning sampling process, the illumination beam and the detector sCMOS do not move, but the translation stage moves, and the moving speed is related to the frame rate of the detector and the sampling method. In the figure, 1 is a sCMOS camera, 2 is a lens, 4 is a half mirror, 5 is an objective lens, 6 is a platform on which a sample is placed, and 7 is a light source. The imaging object is placed on the mobile platf...

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Abstract

The invention discloses a scanning sampling and image processing method of fast imaging. A sCMOS (Complementary Metal-Oxide-Semiconductor) camera is adopted as an imaging tool, and is worked in a subarray (or ROI) mode, the method comprises the following steps: enabling an imaging object to continuously translate vertical to a sampling direction of the sCMOS camera with a set speed by using a moving plateform, performing scanning imaging on the object by using the sCMOS camera, and outputting sampling frames, shifting and overlying the obtained images to obtain an image. By adopting of the high-speed sampling feature of the sCMOS camera under the subarray (or ROI) mode, and shifting and overlying the sampling frames of the sCMOS camera, the generated image is high in resolution, high in signal to noise ratio and low in distortion, and the method is especially suitable for the fast imaging of the large-size object.

Description

technical field [0001] The invention relates to the field of optical scanning technology, in particular to a scanning sampling and image processing method for rapid imaging using scientific research-grade CMOS, that is, sCMOS. Background technique [0002] With the development of modern industry and technology, the demand for fast imaging is becoming stronger, especially for large-volume or large-area object imaging. For example, in biological research, understanding the structure of biological tissues and organs will greatly promote the grasp of their functions, and provide a strong scientific basis for the diagnosis of various functional diseases. However, due to the large size of tissues and organs (such as the brain) and the limited imaging range, multiple regional imaging is required to obtain a complete tissue structure data on a plane; at the same time, because of the specificity of organisms, imaging studies on a large number of samples are required to obtain Statis...

Claims

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Application Information

Patent Timeline
26 Jun 2013
Publication
CN103179331A
IPC
H04N5/225; H04N5/232; H04N5/243; H04N23/76
Inventors
骆清铭; 曾绍群