Device and method for online detection on structural damage of solar panel by utilizing microwaves
A technology for solar panels and structural damage, applied in the direction of using microwave flaw detection, etc., can solve the problems of complex process, inability to online detection, high cost, and achieve the effects of high detection accuracy, high resolution and high safety.
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[0017] Select six intact solar silicon wafers with a size of 125*125mm, and make the following defects through a wire cutting machine: (1) intact silicon wafers; (2) small holes with a diameter of 1mm; (3) holes with a diameter of 1.5mm; (4) A hole with a diameter of 2mm; (5) A scratch with a length of 5mm; (6) A crack with a length of 5mm.
[0018] Using the above-mentioned device to measure the resonant frequency offset evaluation results of six samples with different damage conditions are shown in Table 1:
[0019] Table 1
[0020]
[0021] In Table 1, indicator light 1 is green light; indicator light 2 is red light, indicating that the solar silicon wafer is damaged.
[0022] It can be seen from the experimental results that the threshold of the device to measure defects is 1 mm. Defects smaller than or equal to 1 mm are not easy to cause a shift in resonance frequency and cannot be measured; while defects larger than 1 mm have obvious shifts in resonance frequency an...
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