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Device and method for online detection on structural damage of solar panel by utilizing microwaves

A technology for solar panels and structural damage, applied in the direction of using microwave flaw detection, etc., can solve the problems of complex process, inability to online detection, high cost, and achieve the effects of high detection accuracy, high resolution and high safety.

Inactive Publication Date: 2015-05-13
XI AN JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method does not require a scanning mechanism, and the device structure is relatively simple, but it also has the disadvantages of high cost, limited color display, affected by ambient light, and complicated process
Moreover, at present, most of the solar panel defect detection equipment produced by domestic manufacturers is offline, which is used for random inspection and cannot be detected online, so it is difficult to meet the increasingly stringent requirements of photovoltaic companies.

Method used

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  • Device and method for online detection on structural damage of solar panel by utilizing microwaves
  • Device and method for online detection on structural damage of solar panel by utilizing microwaves

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0017] Select six intact solar silicon wafers with a size of 125*125mm, and make the following defects through a wire cutting machine: (1) intact silicon wafers; (2) small holes with a diameter of 1mm; (3) holes with a diameter of 1.5mm; (4) A hole with a diameter of 2mm; (5) A scratch with a length of 5mm; (6) A crack with a length of 5mm.

[0018] Using the above-mentioned device to measure the resonant frequency offset evaluation results of six samples with different damage conditions are shown in Table 1:

[0019] Table 1

[0020]

[0021] In Table 1, indicator light 1 is green light; indicator light 2 is red light, indicating that the solar silicon wafer is damaged.

[0022] It can be seen from the experimental results that the threshold of the device to measure defects is 1 mm. Defects smaller than or equal to 1 mm are not easy to cause a shift in resonance frequency and cannot be measured; while defects larger than 1 mm have obvious shifts in resonance frequency an...

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Abstract

The invention relates to a device and a method for online detection on the structural damage of a solar panel by utilizing microwaves. According to the device, an active microwave resonance cavity comprises a vector network analyzer, a frequency scanning source, a first isolator, a first tuner and a resonance cavity body which are connected sequentially; and a microwave signal processing system comprises a coupling probe which is positioned in the resonance cavity body, as well as an attenuator, a second tuner, a second isolator and a signal microprocessor circuit which are sequentially connected with the coupling probe. According to the method, microwave signals are transmitted into the surface of the detected solar panel through the resonance cavity body, one part of the microwave signals are absorbed and reflected while the other part of the microwave signals penetrate through the solar panel to reach a metal background to be transmitted totally; microwave-return signals are collected by the coupling probe and then processed by the signal microprocessor circuit, so that the instant resonance cavity frequency offset (Delta f) is obtained; and therefore, the structural damage of the detected solar panel can be detected. The device and the method provided by the invention can be used for performing the real-time online monitoring on the structural damage condition of the solar panel, so that the requirement of nondestructive detection on the solar panel in a production line is satisfied.

Description

technical field [0001] The invention relates to the technical field of solar panel structure damage detection, in particular to a device and method for online detection of solar panel structure damage by using microwaves. Background technique [0002] In 2008, my country's solar panel production was 2895MW, and in 2009 it reached 4382MW, accounting for 40% of global production. my country has become the world's largest producer of solar panels. In 2010, the domestic output of photovoltaic cells reached 7GW, of which more than 90% were exported. According to the market development trend of solar panel materials predicted by China Renewable Energy Society, the global demand in 2013 will be three times that of 2008. There are about 443 solar panel and module manufacturers in China, which have formed a whole industrial chain production enterprise from silicon preparation to solar module production, and their production capacity has leapt to the forefront of the world. At prese...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N22/02
Inventor 谭海明刘启达向锋
Owner XI AN JIAOTONG UNIV