Pulse-laser-based rapid measurement method of attenuation coefficient and scattering albedo of semi-transparent medium

A technology of scattering albedo and semi-transparent medium, which is applied in the direction of scattering characteristic measurement, measurement device, and material analysis through optical means, and can solve the problem of slow measurement speed

Active Publication Date: 2013-11-13
HARBIN INST OF TECH
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Problems solved by technology

[0005] In order to solve the problem of slow measurement speed of the translucent medium radiation measurement method based on the solution of the inverse problem, the present invention proposes a fast measurement method of the attenuation coefficient and scattering albedo of the translucent medium based on pulsed laser

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  • Pulse-laser-based rapid measurement method of attenuation coefficient and scattering albedo of semi-transparent medium
  • Pulse-laser-based rapid measurement method of attenuation coefficient and scattering albedo of semi-transparent medium
  • Pulse-laser-based rapid measurement method of attenuation coefficient and scattering albedo of semi-transparent medium

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specific Embodiment approach 1

[0020] Specific embodiments 1. The method for fast measurement of attenuation coefficient of translucent medium and scattering albedo based on pulsed laser described in this embodiment, the specific steps of the method are:

[0021] Step 1. Apply a coating with a blackness of 0.95-1 to one side of the translucent test piece, use a Gaussian pulse laser to generate a Gaussian pulse laser, and the Gaussian pulsed laser beam is vertically incident on the uncoated side of the test piece surface, using a single photon counter to measure the time-domain hemispherical reflection signal of the non-coated side of the translucent medium, and obtain the time-domain reflection signal curve of the specimen and the peak value R of the curve max ;

[0022] Step 2. Use the peak value R of the obtained time-domain reflection signal curve max , according to the geometric thickness L of the specimen and the laser pulse width ct of the length dimension p The relationship between the size of the ...

specific Embodiment approach 2

[0031] Specific embodiment 2. This embodiment is a further description of the rapid measurement method for the attenuation coefficient and scattering albedo of a semi-transparent medium based on pulsed laser described in the specific embodiment 1. The attenuation coefficient of the medium to be measured is obtained in step 2. The relationship between β and the scattering albedo ω of the medium to be measured is through the formula:

[0032] R max ≈ 0.05 βωct p ln ( βL ) + ( 0.375 - 0.8 βct ...

specific Embodiment approach 3

[0034] Specific Embodiment 3. This embodiment is a further description of the rapid measurement method for the attenuation coefficient and scattering albedo of semi-transparent media based on pulsed laser described in Embodiment 1. The inverse problem algorithm described in Step 3 and Step 4 It is realized by ant colony algorithm.

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Abstract

The invention discloses a pulse-laser-based rapid measurement method of an attenuation coefficient and scattering albedo of a semi-transparent medium, belongs to the technical field of semi-transparent medium radiation measurement, and solves the problem of low measurement speed of the semi-transparent medium radiation measurement method on the basis of an inverse problem solving. A black coating is coated at the surface of one side of a to-be-tested semi-transparent test-piece; a gaussian pulse laser beam is utilized to vertically enter the surface of one side of the test-piece without the coating; a time-domain hemisphere reflection signal of the semi-transparent medium is measured by adopting a single photon counter; the attenuation coefficient beta of a to-be-tested medium and the value of the scattering albedo omega of the to-be-tested medium are set; the least square difference is formed by an estimation value of the time-domain hemisphere reflection signal and the time-domain hemisphere reflection signal of the semi-transparent medium measured by the single photon counter; whether the difference is smaller than the threshold is judged; if so, the set attenuation coefficient beta of the to-be-tested medium and the scattering albedo omega of the to-be-tested medium are taken as results. The rapid measurement method is suitable for the semi-transparent medium radiation measurement.

Description

technical field [0001] The invention belongs to the technical field of radiation physical property measurement of translucent media. Background technique [0002] The thermal radiation physical property parameters of translucent media are the basic basis for measuring whether a material can adapt to the needs of a specific thermal process working environment, and are the key parameters for basic research, analysis, calculation, and engineering design of a specific thermal process. One of the most basic physical properties. Therefore, countries all over the world have attached great importance to the study of thermal radiation physical properties of materials. The measurement and research of thermal radiation physical properties of materials is of great significance to aerospace, national defense, and civil industries. Research also plays an important role in promoting. [0003] Attenuation coefficient and scattering albedo are an important parameter to characterize the rad...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17G01N21/49
Inventor 张彪齐宏任亚涛孙双成阮立明
Owner HARBIN INST OF TECH
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