Electronic replacement part technology state automatic detection system and method based on PXI bus

Abstract

The invention discloses an electronic replacement part technology state automatic detection system based on a PXI bus. The replacement part technology state automatic detection system based on the PXI bus comprises a controller with automatic detection system software, a PXI system, a VPC connector, an adaptor, a keyboard connected with the controller and a displayer, wherein the PXI system is formed by a PXI case and more than two PXI modules inserted into corresponding inserting grooves of the PXI case; the adaptor comprises a system self-test adaptor; the controller is connected with the PXI case through the PXI bus; signal ends of all PXI modules are connected with the self-test adaptor or a special test adaptor through the VPC connector; the system self-test adaptor comprises a standard current source, a standard resistor R, a reference source circuit, a square-wave generator, a signal route N1, a signal route N2, a signal route N3, a first copper foil short-circuit wire, a second copper foil short-circuit wire, a third copper foil short-circuit wire, a fourth copper foil short-circuit wire and a fifth copper foil short-circuit wire. The replacement part technology state automatic detection system based on the PXI bus has the advantages that due to the adoption of the adaptor, separating performance of an electronic replacement part to be tested and a PXI port is good, the system has good universality and expansibility, polytypic signals can be tested, and detection automation degree is high.

Description

technical field [0001] The invention relates to a PXI bus-based automatic detection system and method for the technical state of electronic spare parts, and the applicable detection objects are mainly various intermediate frequency and low frequency electronic spare parts of electronic equipment. Background technique [0002] With the improvement of production technology and process level, there are more and more circuit boards with advanced technologies such as high density and advanced packaging, and the requirements for circuit board testing are also getting higher and higher. In the past circuit board testing, fixtures have been used to form a test network or by welding test pads on the circuit board nodes. During the test process, testers are required to manually operate various circuit probes for testing. Using this traditional method to build a circuit board test system has a long development cycle, low efficiency, high cost, and error-prone. [0003] Deficiencies i...

AI Technical Summary

Problems solved by technology

[0004] 1. The development process of TPS (test program set) is cumbersome and the workload is heavy, and the developed test program is highly dependent and poor in portability;

[0005] 2. TPS development is difficult and requires high technical requirements for developers

[0006] 3. The test adapter has poor versatility, and it is often necessary to specially develop corresponding adapter boards for different test objects, resulting in low test efficiency and high cost

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