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Broadband multi-beam microwave source correlation reflection measurement system based on vco modulation

A technology of reflection measurement and microwave source, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of high cost, small modulation degree, and not easy to change, etc., and achieve the effect of large output power and flat output power

Active Publication Date: 2016-08-31
SOUTHWESTERN INST OF PHYSICS
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Problems solved by technology

The microwave frequency corresponding to the plasma electron density of the HL-2A tokamak is usually in the centimeter-wave to millimeter-wave range. If multiple independent microwave sources are used, the cost is high, and once the microwave frequency is determined, it is not easy to change; Frequency modulation technology, as the modulation frequency increases, the modulation degree becomes smaller and smaller

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  • Broadband multi-beam microwave source correlation reflection measurement system based on vco modulation
  • Broadband multi-beam microwave source correlation reflection measurement system based on vco modulation

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Embodiment Construction

[0013] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0014] Such as figure 1 As shown, a VCO modulation-based broadband multi-beam microwave source correlation reflection measurement system provided by the present invention includes a modulation signal source 1, a DC bias device 16, a DC power supply 2, a broadband VCO source 3, and a power divider 4. The first group of power amplifiers 5, the first group of bandpass filters 6, the frequency multiplier group 7, the second group of power amplifiers 13, the second group of bandpass filters 14, the power combiner 15, the transmitting antenna 8, the receiving Antenna 9, superheterodyne receiving system 10,

[0015] The DC biaser 16 is composed of a capacitor C and an inductor L, the output end of the modulation signal source 1 is connected to one end of the capacitor C, the other end of the capacitor C is connected in parallel with one end of the i...

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Abstract

The invention belongs to the field of nuclear fusion plasma microwave diagnosis, and specifically discloses a wide-band multi-beam microwave source correlation reflection measurement system based on VCO modulation. The output end of the modulation signal source is connected to the input end of a DC bias device, and the The power supply terminal is connected to the output terminal of the DC power supply, and the output terminal of the DC bias device is connected to the broadband VCO source, power divider, power amplifier, bandpass filter, frequency multiplier group, power combiner, and transmitting antenna in turn, and the transmitting antenna The output terminal of the superheterodyne receiving system is connected to the output terminal of the receiving antenna, and the input terminal of the receiving antenna receives the microwave signal reflected from the plasma. The system has the advantages of low cost, high harmonic order, equal frequency interval, and adjustable frequency.

Description

technical field [0001] The invention belongs to the field of nuclear fusion plasma microwave diagnosis, and in particular relates to a broadband multi-beam microwave source correlation reflection measurement system based on voltage controlled oscillator VCO (Voltage Controlled Oscillator) modulation. Background technique [0002] In the research of controlled nuclear fusion experiments, the turbulent disturbance and distribution of different scales inside the plasma determine the confinement and transport of the plasma. Obtaining the relationship between these disturbances of different scales is useful for studying the transport of plasma particles, and the magnetic fluid is unstable. properties, turbulence distribution and correlation, highly confined mode operation, and plasma profile control and operation. Microwave diagnosis can go deep into the plasma to measure electron density and electron temperature distribution and disturbance with high spatiotemporal resolution. I...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 石中兵刘泽田
Owner SOUTHWESTERN INST OF PHYSICS