Dynamic bottleneck analytical method of semiconductor production line
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- BEIJING UNIV OF CHEM TECH
- Publication Date
- 2014-03-26
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a dynamic bottleneck analysis method of a production line, which belongs to the field of semiconductor processing and automatic control, in particular to a dynamic bottleneck analysis method of a semiconductor production line. Background technique
[0002] The semiconductor manufacturing industry is a capital-intensive high-tech industry, which has great strategic value for economic development. Under the background of the transfer of the world's manufacturing center to the Asia-Pacific region and the sustained and rapid development of my country's economy, my country's semiconductor industry has developed rapidly. In order to continue to maintain the good momentum of the development of my country's semiconductor manufacturing industry and enhance market competitiveness, it is necessary not only to expand the scale but also to improve production efficiency. The semiconductor production line is considered to be the most complex...