Photoetching machine double-frequency laser interferometer vertical measurement light path reflecting mirror adjustment device
A dual-frequency laser interferometry and optical path measurement technology, which is applied in the field of vertical measurement optical path reflector adjustment device of dual-frequency laser interferometer of lithography machine, can solve the problem that there is no locking function, which affects the measurement accuracy and cannot realize the position of the long reflector Posture adjustment and other issues to reduce surface error and improve measurement accuracy
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[0020] The implementation of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0021] A dual-frequency laser interferometer vertical measurement optical path reflector adjustment device for lithography machine, characterized in that three bosses 11 are arranged on the upper part of the reflector base 2, and the reflector 1 is bonded to the lower ends of the three bosses 11 One side of the reflector 1 connects the single spring pin 8 on the reflector 1 with the screw B9 on the reflector seat 2 through a tension spring A10, and the other side of the reflector 1 through two tension springs B7 Connect the double spring pin 5 on the reflector 1 with the two screws A6 on the reflector seat 2; install a fixed foot assembly 3 and two adjustment foot assemblies 4 on the reflector seat 2, the A fixed foot assembly 3 and two adjustment foot assemblies 4 are arranged in a triangle on the reflector base 2, and the reflector base 2 pass...
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