Programmable Built In Self Test (pBIST) system

Abstract

A programmable Built In Self Test (pBIST) system used to test embedded memories where a plurality of memories requiring different testing conditions are incorporated in an SOC. The pBIST Read Only Memory storing the test setup data is organized to eliminate multiple instances of test setup data for similar embedded memories.

Description

technical field [0001] The technical field of the invention is high speed memory testing, and more particularly, a built-in self-test (BIST) system for embedded memories. Background technique [0002] Testing fabricated integrated circuits to determine proper operation has always been a challenging task, especially with regard to on-board memory functionality. There are two main types of device failures caused by design flaws. Design defects occur when integrated circuits are manufactured to design specifications that do not provide proper function for the intended use. This defect affects any integrated circuit manufactured until the design defect is corrected. Integrated circuit manufacturers must detect and correct such defects before shipping large numbers of devices to customers to avoid costly recalls. In contrast to design defects, manufacturing defects involve some failure in the manufacture of integrated circuits. A manufacturing defect will generally affect not...

AI Technical Summary

Problems solved by technology

Manufacturing defects will generally affect all parts manufactured

These techniques have several limitations

The main limitation is interfacing with the CPU which functions in mostly inaccessible memory

Inability to do back-to-back access to all memory is another severe limitation

Third, direct memory access (DMA) external memory access cannot be achieved at full processor speed during memory testing while the device is in wafer form

This can result in failure to observe a significant number of

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