A kind of preparation method of Gan-based white light flip-chip
A flip-chip and white light technology, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of GaN-based LED flip chips that cannot directly emit white light and growth substrate restrictions, so as to reduce packaging costs, The effect of improving packaging yield
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specific Embodiment 1
[0026] Such as Figure 1a As shown, a buffer layer, an n-type GaN layer 102 , an active layer 103 , and a p-type GaN layer 104 are sequentially grown on a silicon substrate 101 by MOCVD to form a GaN-based semiconductor multilayer structure. Such as Figure 1b As shown, an Ag layer 105 is deposited on the surface of the p-type GaN layer 104 as a reflective metal layer. The semiconductor multi-layer structure is etched by an ICP method to expose the n-type GaN layer 102 to form an N electrode hole. An Al / Ti / Au multilayer metal film 106 is evaporated on the surface of the Ag layer 105, and the multilayer metal film 106 is alloyed at 400°C. A layer of dielectric film 107 is deposited on the part surface of the multilayer metal film 106 and the sidewall of the N electrode hole, and a P electrode 108 is prepared on the exposed multilayer metal film 106, then Al is deposited in the N electrode hole and a plurality of The N electrode holes are connected to form an N electrode 109 ...
specific Embodiment 2
[0027] Such as Figure 2a As shown, a buffer layer, an n-type GaN layer 202, an active layer 203, and a p-type GaN layer 204 are sequentially grown on a sapphire substrate 201 by MOCVD to form a GaN-based semiconductor multilayer structure. Such as Figure 2b As shown, an Ag layer 205 is deposited on the surface of the p-type GaN layer 204 as a reflective metal layer. The semiconductor multilayer structure is etched by an ICP method to expose the n-type GaN layer 202 to form an N electrode hole. An Al / Ti / Au multilayer metal film 206 is evaporated on the surface of the Ag layer 205, and the multilayer metal film 206 is alloyed at 400°C. A layer of dielectric film 207 is deposited on the part surface of the multilayer metal film 206 and the sidewall of the N electrode hole, and a P electrode 208 is prepared on the exposed multilayer metal film 206, then Al is deposited in the N electrode hole and a plurality of The N electrode holes are connected to form an N electrode 209 , ...
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