Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A circuit resistance testing system of electrical equipment and a contact state evaluation method

A technology for electrical equipment and loop resistance, applied in the direction of measuring resistance/reactance/impedance, measuring electricity, measuring devices, etc., can solve problems such as inability to meet the requirements of field testers, inability to meet engineering application requirements, equipment cost and weight increase, etc.

Inactive Publication Date: 2016-08-24
WUHAN UNIV
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] At present, most of the loop resistance measuring instruments at home and abroad use switching power supplies, which can only output a current of 100A to 300A. To generate a larger current, the cost and weight of the equipment will be greatly increased, which basically cannot meet the requirements of field testers.
There are foreign literature reports that using electrolytic capacitor bank as energy storage power supply can release 1kA current, but the capacitor bank itself has a mass of 10kg, and the use and maintenance of electrolytic capacitors is very difficult, which cannot meet the requirements of engineering applications.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A circuit resistance testing system of electrical equipment and a contact state evaluation method
  • A circuit resistance testing system of electrical equipment and a contact state evaluation method
  • A circuit resistance testing system of electrical equipment and a contact state evaluation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] figure 1 It is a schematic diagram of the test circuit of the present invention. The system includes a charging circuit, a main discharge circuit, data acquisition and processing modules; the charging circuit includes a charger, a supercapacitor, and a charging protection resistor; the main discharge circuit includes a supercapacitor, a thyristor, a shunt, and the electrical equipment under test; data acquisition and processing The module includes a voltage isolation sensor, an industrial computer, and the inside of the industrial computer includes a data acquisition card, a data processing module, and a display module; the charger is connected to the supercapacitor, and the supercapacitor forms a series circuit with the thyristor, shunt, and the electrical equipment under test, and the shunt, The electrical equipment under test is respectively connected with the voltage isolation sensor, the voltage isolation sensor and the thyristor are respectively connected with the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an electrical equipment loop resistor test system and a contact state evaluation method. According to the requirement for performance detection of conductive loop nodes of various kinds of electrical equipment, characteristics of contact resistors of the conductive loop nodes of the electrical equipment and a basic range of loop resistor measuring are integrated, and a supercapacitor is adopted to generate kilo-ampere-level long-wave-tip impact currents on the basis that electromagnetic interference resistance and measurement accuracy are met. According to loop resistor difference reflected by the conductive loop nodes (a GIS conductive loop, a high-voltage breaker, a high-medium voltage isolating switch, a high-medium busbar and the like) of the electrical equipment of an electric power system, loop resistance values of the electrical equipment are accurately measured, the contact state of the electrical equipment is evaluated through the change rate along with impact current increase of loop resistors, and the defect that a traditional test method judges only through a management value.

Description

technical field [0001] The invention provides a loop resistance testing system and a contact state evaluation method for electrical equipment, which belong to the technical field of loop resistance detection. In view of the needs of performance testing of conductive loop nodes of various electrical equipment, the characteristics of the contact resistance of conductive loop nodes of various electrical equipment and the basic range of loop resistance measurement are integrated. [0002] On the basis of anti-electromagnetic interference and measurement accuracy, the circuit resistance of the electrical equipment is accurately measured; at the same time, a method for evaluating the contact state of the electrical equipment is provided through the rate of change of the loop resistance with the increase of the inrush current. Background technique [0003] The contact resistance of the conductive loop node of the electrical equipment is composed of the contact resistance of the con...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/14G01R31/02
Inventor 鲁铁成周蠡张博余光凯万家伟
Owner WUHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products