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An up-illuminated X-ray fluorescence spectrometer and its control method

A technology of fluorescence spectrometer and light pipe, which is applied in the field of X-ray fluorescence spectrometer, can solve problems such as inability to accurately judge the time of calibration, deviation of system detection results, small size of calibration sheet, etc., to achieve improved penetration, strong real-time performance, and high precision Effect

Active Publication Date: 2017-03-01
SUZHOU 3V DETECTION INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In addition, when calibrating, the existing X-ray fluorescence spectrometers are regularly calibrated manually by using an external calibration sheet. The calibration sheet is generally a high-purity metal standard product. Generally, a calibration sheet can only calibrate one type of channel. Therefore, the equipment is equipped with multiple calibration sheets, which are small in size, expensive, and easy to lose
Due to issues such as employees and systems, companies often cannot accurately judge the time of calibration, and it is easy to fail to complete the calibration work on a regular basis, resulting in deviations in system testing results

Method used

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  • An up-illuminated X-ray fluorescence spectrometer and its control method
  • An up-illuminated X-ray fluorescence spectrometer and its control method
  • An up-illuminated X-ray fluorescence spectrometer and its control method

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Embodiment Construction

[0048] The technical solution in the embodiment will be specifically, clearly and completely described below in conjunction with the drawings in the embodiment.

[0049] In order to meet the detection thickness requirements of coating samples and realize fixed-point measurement, this invention designs a top-illuminated X-ray fluorescence spectrometer, which can detect single-coating, multi-coating and ultra-thick coating samples, and can measure at fixed points with small light spots , Can accurately measure small samples, fast speed, high measurement accuracy.

[0050] refer to figure 1 As shown, it is a schematic diagram of the three-dimensional structure of a top-illuminated X-ray fluorescence spectrometer of the present invention, figure 2 is a schematic diagram of the three-dimensional structure of the movable sample platform, figure 2 During actual installation at figure 1 below.

[0051] A top-illuminated X-ray fluorescence spectrometer, which includes a light pip...

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PUM

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Abstract

The invention discloses an upward-lighting type X-ray fluorescence spectrophotometer and a control method thereof. The X-ray fluorescence spectrophotometer comprises a light pipe mounting unit, a detector unit, a collimator, a high-voltage assembly unit, a movable sample platform, a helium inflating unit, a control unit and a channel correction unit, wherein the channel correction unit comprises a composite correction sheet, and the movable sample platform is horizontally arranged below a light pipe and the collimator. The control method comprises the steps of firstly correcting by virtue of the channel correction unit, then starting the high-voltage assembly unit to excite the light pipe to generate an X ray penetrating through the collimator to irradiate the surface of a sample with an incident angle of 90 degrees, and receiving generated X-ray fluorescence signals by virtue of a detector. The upward-lighting type X-ray fluorescence spectrophotometer has the beneficial effects that by an upward-lighting manner, a light path can be prevented from being polluted by scattering fluorescence generated when the sample is excited by the X ray, meanwhile, the penetrating power of the X ray is improved, and the standby-voltage control on the X ray and the automatic correction of the spectrophotometer can be realized; the spectrophotometer is high in precision and speed, good in stability, high in instantaneity, small in calculated quantity and high in universality.

Description

technical field [0001] The invention relates to an X-ray fluorescence spectrometer, in particular to an upside-illuminated X-ray fluorescence spectrometer, which belongs to the field of X-ray fluorescence spectrometer manufacture. [0002] The invention also relates to a control method of an X-ray fluorescence spectrometer, in particular to a control method capable of realizing X-ray backup pressure control and automatic calibration of the spectrometer. Background technique [0003] X-ray fluorescence spectrometer is an instrument mainly used for qualitative and quantitative analysis of chemical elements, and its analytical element range is generally (11) Na- (92) U, its advantage is that the analysis speed is fast, and it can carry out non-destructive analysis, on-site analysis, online analysis and in-situ analysis, so the application field is very wide. [0004] X-rays have huge energy and strong penetrating power, so traditional optical devices cannot affect the directi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 杨振杨剑
Owner SUZHOU 3V DETECTION INSTR
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