Method for manufacturing p-type GaN low-resistance-value ohmic contact layer
A technology of ohmic contact layer and low resistance value, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problem of low resistivity, reduce the working voltage, increase the probability of tunneling through the contact barrier region between metal and semiconductor, Ease of promoting the effect of the application
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[0024] Such as figure 1 As shown, the flow chart of the preparation method of the p-type GaN low-resistance ohmic contact layer provided by the present invention sequentially includes processing the substrate 101, growing a buffer layer 102 on the substrate, growing a u-type GaN layer 103 on the buffer layer, growing an n-type GaN layer 104 on the u-type GaN layer, growing an MQW active layer 105 on the n-type GaN layer, growing an AlGaN layer 106 on the MQW active layer, growing a first p-type GaN layer 107 on the AlGaN layer, and A second p-type GaN layer 108 is grown on the first p-type GaN layer, the Mg concentration in the second p-type GaN layer is greater than the Mg concentration in the first p-type GaN layer, the second p-type GaN layer and the first p-type GaN layer The layers are grown under the same temperature condition and the same pressure condition, and the growth rate of the second p-type GaN layer is 1 / 5-1 / 3 of the growth rate of the first p-type GaN layer. ...
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