Three-dimensional atom probe sample preparation first stage polishing equipment

An atom probe, three-dimensional technology, applied in the field of first-stage polishing equipment for three-dimensional atom probe sample preparation, can solve the problems of long time for sample preparation, complicated equipment operation, expensive equipment, etc., and achieves easy observation and data collection, flexible Strong sex and weight saving effect

An atom probe, three-dimensional technology, applied in the field of first-stage polishing equipment for three-dimensional atom probe sample preparation, can solve the problems of long time for sample preparation, complicated equipment operation, expensive equipment, etc., and achieves easy observation and data collection, flexible Strong sex and weight saving effect

CN104390835BInactive Publication Date: 2017-01-04NANJING UNIV OF SCI & TECH

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  • Three-dimensional atom probe sample preparation first stage polishing equipment
  • Three-dimensional atom probe sample preparation first stage polishing equipment
  • Three-dimensional atom probe sample preparation first stage polishing equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0029] Insert an alligator clip connected to the anode of the power supply on the pin 15, and clamp the tail of a vertical tweezers. The tip of the tweezers holds the sample to be polished, and the middle of the tweezers is held by a small clip to fix the sample to be polished. Place a beaker filled with polishing liquid under the sample and on the base 4, so that the bottom of the sample can be immersed in the polishing liquid. Wrap one end of the metal wire into a ring and soak it in the polishing solution, and stick it close to the inner wall of the beaker. The middle part is fixed on the top of the column 17 with screws, and the other end is connected to the cathode of the power supply. The lower end of the column 17 is screwed into one end of the base 4 to be fixedly connected. The support plate 5 is a concave plate, the bottom of which is fixed on the end of the base 4 away from the column 17 by three parallel bolts, and the liner 8 is connected and fixed in front of th...

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Abstract

The invention discloses a three-dimensional atom probe sample preparation first-stage polishing device. The three-dimensional atom probe sample preparation first-stage polishing device comprises a base, a supporting plate, a liner plate, an eccentric wheel, a first lever, a second lever, a connecting rod, a fixed plate, a stand column, a motor and a bolt. By adopting the polishing device, the manual polishing process is changed to the mechanical polishing process, so that the manpower is saved, and the precision is improved. The rotation of the motor is converted to the up-down movement through the levers and the eccentric wheel, and the application requirement can be met. By adopting the polishing device, the spatial position of the preparation of samples in different sizes can be adjusted, and the flexibility is strong. By adopting the aluminum alloy material, the weight is reduced, and the cost is reduced. The polishing device is electrified to execute the electrochemical polishing, so that the polishing size is fixed, the precision is high, the sample quality is good, the taper is large, and convenience in observation of the three-dimensional atom probe and data acquisition can be realized. A simple mechanical device capable of rapidly preparing a sample is provided for preparing a three-dimensional atom probe metal sample.

Description

technical field [0001] The invention belongs to equipment for preparing characterization material samples, in particular to a first-stage polishing equipment for three-dimensional atom probe sample preparation. Background technique [0002] The 3D atom probe is a measurement and analysis method with atomic-level spatial resolution. Based on the principle of "field evaporation", the three-dimensional atom probe applies a strong voltage pulse or laser pulse to the sample, turning its surface atoms into ions one by one, and removes and collects them. This requires that the sample needs to be made into a needle tip with a diameter of several microns before it can be analyzed in the 3D atom probe. In the first stage of sample preparation, the rod-shaped sample needs to be roughly polished with a polishing solution to make a relatively thin needle tip. , and then to the second stage of polishing under the microscope. [0003] For the preparation of traditional metal samples, man...

Claims

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Application Information

Patent Timeline
04 Jan 2017
Publication
CN104390835B
IPC
G01N1/32
Inventors
周琪; 沙刚