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Scattered light measuring device

A measurement device and scattered light technology, which is applied in the direction of measurement device, color/spectral characteristic measurement, diagnosis by using light, etc., can solve the problem of complex structure of the device and achieve the effect of simple structure

Inactive Publication Date: 2016-09-28
OLYMPUS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is, there is a problem with LEBS that the device structure is complicated in the detection of scattered light on the surface of a simple scatterer

Method used

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Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0038] figure 1 It is a schematic diagram showing the configuration of the optical measurement device 1 and the scattered light measurement probe 101 according to the first embodiment. figure 2 It is a schematic diagram which shows the structure of the main part of the optical measurement apparatus 1 which concerns on this Embodiment 1. FIG. Further, a scattered light measurement device is constituted by the optical measurement device 1 and the scattered light measurement probe 101 .

[0039] like figure 1 As shown, the scattered light measurement device including the optical measurement device 1 and the scattered light measurement probe 101 non-invasively detects, as information, scattered return light scattered back from a relatively weak scattering medium such as living tissue and the like.

[0040] The optical measurement device 1 includes: a light source 10 that emits light including light of at least a measurement reference wavelength; a branching part 11 that conce...

Embodiment approach 2

[0058] Next, Embodiment 2 of the present invention will be described. Figure 5 It is a conceptual diagram showing the optical measurement device 1a and the scattered light measurement probe 101a according to the second embodiment. Image 6 It is a plan view schematically showing the arrangement of the optical fibers of the scattered light measurement probe 101a according to the second embodiment. In addition, for and in figure 1 The same reference numerals are attached to the same components as the above-mentioned components described in the description and the like. In the above-mentioned Embodiment 1, the case where there is only one optical fiber has been described, but in order to increase the amount of light to be detected, a plurality of optical fibers may be provided. In Embodiment 2 below, a case where a plurality of optical fibers are used will be described.

[0059] like Figure 5 As shown, the scattered light measurement device including the optical measuremen...

Embodiment approach 3

[0074] Next, Embodiment 3 of the present invention will be described. Figure 9 It is a conceptual diagram showing the optical measurement device 1b and the scattered light measurement probe 101b according to the third embodiment. Figure 10 It is a plan view schematically showing the optical fiber of the scattered light measurement probe 101b according to the third embodiment. In addition, for and in figure 1 The same reference numerals are attached to the same components as the above-mentioned components described in the description and the like. In the above-mentioned Embodiment 2, the case where a plurality of optical fibers are provided in order to increase the amount of light to be detected has been described, but the method for obtaining the signal intensity may be changed according to the signal intensity of each optical fiber.

[0075] like Figure 9 As shown, the scattered light measurement device including the optical measurement device 1b and the scattered ligh...

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Abstract

A scattered light measurement device, comprising an optical measurement device (1) and a scattered light measurement probe (101), wherein the optical measurement device (1) has: a light source (10), which emits light at least including light of a wavelength of a measurement object; A light detector (12), which detects light received by the scattered light measuring probe (101); a branch (11), which guides light from the light source (10) to the scattered light measuring probe (101), and The light of the scattered light measuring probe (101) is guided to the photodetector (12); and the control part (13) evaluates the scattering characteristic of the surface layer of the inspected object based on the light detected by the photodetector (12), the The scattered light measuring probe (101) has an optical fiber (102), which is connected to the optical measuring device (1) at one end, transmits light from a light source and illuminates the object to be inspected, and communicates with the object to be inspected at the other end. Object contact, receive the light irradiated on the object to be inspected and propagate in the interior of the object to be inspected and return the light, guide the light as an optical signal to the photodetector (12), and the optical fiber (102) propagates the light with approximately A rod-shaped core (1020), the core (1020) has a diameter determined according to the detection depth of the object to be inspected.

Description

technical field [0001] The present invention relates to a scattered light measuring device that measures information related to the internal structure of a measurement object as the amount of scattering and absorption of light. Background technique [0002] Conventionally, it is known that scattered return light scattered back from a relatively weak scattering medium such as living tissue is detected as interference-enhanced light based on the spatial coherence (spatial coherence) of the illumination light (see Non-Patent Document 1). The spectroscopic information measurement technique utilizing this phenomenon is called LEBS (Low-Enhanced Backscattering Spectroscopy: Low-Coherence Enhanced Backscattering Spectroscopy), and the mean free path (the inverse of the scattering coefficient) relative to the scattering in the scattering medium is also carefully studied. Characteristics of the interference pattern of ls* (see Non-Patent Document 2). The scattering mean free path ls...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B1/00G01N21/17G01N21/27
CPCA61B1/00167A61B1/042A61B1/07G01N21/474G01N2021/475A61B5/0059G01N2021/4745
Inventor 伊藤辽佑
Owner OLYMPUS CORP