A microscopic analysis device

A microscopic analysis and atomic force microscopy technology, applied in the field of microscopic analysis, can solve the problem that atomic force microscopy imaging cannot qualitatively analyze samples, and achieve the effect of expanding detection methods
CN104677865BActive Publication Date: 2018-03-20吉林省恒吉科技有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
吉林省恒吉科技有限公司
Publication Date
2018-03-20

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Abstract

The invention provides a microscopic analysis device, which includes a laser light source device, a light transmission device, a random optical reconstruction microscopic device, an atomic force microscopic device, a sample carrying device and an information integration output device. The light source beam provided by the laser light source device is introduced into the optical reconstruction microscopic device by the light transmission device, and the optical reconstruction microscopic imaging is performed on the sample to be tested on the sample carrying device; at the same time, the atomic force microscopic device performs atomic force Microscopic imaging; the information integration output device integrates random optical reconstruction microscopic information and atomic force microscopic information to output. The method solves the problem that the existing atomic force microscopy imaging cannot qualitatively analyze samples, and can be widely used in the fields of biology, polymers and materials.
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Description

technical field

[0001] The invention relates to a combination technology of a stochastic optical reconstruction micro-device and an atomic force micro-device, belonging to the field of microanalysis. Background technique

[0002] Optical microscope is an essential tool for biologists to do research and explore the mysteries of life. Light microscopy has been used to gain a first glimpse at the intricate structure and morphology inside cells. However, limited by the optical diffraction limit, the resolution of conventional optical microscopes is difficult to reach below 200nm. In recent years, the invention of super-resolution fluorescence microscopy breaks through the optical diffraction limit. These include stimulated emission depletion microscopy (STED), saturated structured illumination microscopy (SSIM), stochastic optical reconstruction microscopy (STORM), and photoactivated localization microscopy (PALM). The three-dimensional spatial resolution of these methods is ...

Claims

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