High-power silicon controlled rectifier testing table
A test bench and high-power technology, which is applied in the field of testing the performance of high-power thyristor components, can solve problems such as breakdown of power components, threats to personal safety of staff, equipment accidents, etc., and achieve the effect of avoiding breakdown
Inactive Publication Date: 2015-06-24
SHANDONG IRON & STEEL CO LTD
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Problems solved by technology
However, for the thyristor components of large-scale transmission systems, it is impossible to test the performance of the thyristor under the specified crimping torque, and the closed installation is inconvenient for online measurement of the thyristor performance
Once the power components break down due to the manufacturing process defects of the thyristor, it will cause serious equipment accidents and even threaten the personal safety of the staff.
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[0015] Combine below Attached picture The present invention will be further described with reference to specific embodiments.
[0016] Such as figure 1 As shown: taking the test of 3000A thyristor as an example, a high-power thyristor test bench includes a steel casing 10, a thyristor 6, a bottom surface 1 of the test bench and an electrical control part 14, and the casing 10 is surrounded by There are four steel columns 5, which play a role in fixing the entire test system. There is a round hole on the top of the casing 10, and a nut 11 is fixed above the round hole. The center of the hole is used as a vertical line perpendicular to the bottom surface 1, and the vertical foot is used as the center of the circle. A circular steel plate 2 is fixed on the bottom surface, a circular insulating plate 3 is fixed above the circular steel plate 2, a copper plate 4 is fixed above the circular insulating plate 3, and a thyristor 6 is placed above the copper plate 4, which can be A...
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The invention discloses a high-power silicon controlled rectifier testing table. The high-power silicon controlled rectifier testing table comprises a steel shell, a silicon controlled rectifier and a bottom face. Four steel column supports are arranged on the periphery of the shell. A circular hole is formed in the top. A nut is fixed to the upper portion of the circular hole, a vertical line is made with the circle center of the circular hole to be perpendicular to the bottom face, a circular steel plate is fixed to the bottom face with the perpendicular foot as the circle center, a circular insulating plate is fixed to the upper portion of the circular steel plate, a copper plate is fixed to the upper portion of the circular insulating plate, the silicon controlled rectifier is arranged above the copper plate, a copper plate, a circular insulating plate and a circular steel plate are arranged above the silicon controlled rectifier in sequence, and the two copper plates are connected with led-out wires in a welding mode respectively. According to the high-power silicon controlled rectifier testing table, the steel shell is adopted, the working state of the silicon controlled rectifier under the pressure welding torque can be simulated, the performance of the silicon controlled rectifier under the specified pressure welding torque can be rapidly and effectively tested, and therefore it is avoided that due to the manufacturing technology defect, a power element is broken through during using.
Description
technical field [0001] The invention relates to a thyristor test bench, which is especially suitable for testing the performance of high-power thyristor elements. Background technique [0002] At present, the known testing method of thyristor is: test the forward and reverse resistance of thyristor, then apply a weak voltage to the gate, test the forward and reverse resistance of thyristor, and judge whether the thyristor is good or bad according to the measured value. But for thyristor components of large transmission system, it is impossible to test the performance of thyristor under the specified crimping torque, and the closed installation is inconvenient for online measurement of thyristor performance. Once the power components break down due to the manufacturing process defects of the thyristor, it will cause serious equipment accidents and even threaten the personal safety of the staff. Contents of the invention [0003] Aiming at the deficiencies of the prior art,...
Claims
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IPC IPC(8): G01R31/26
Inventor 段文宇李晓辉王信尧张国锋王晔李德松王成龙
Owner SHANDONG IRON & STEEL CO LTD