Direct connection type testing device for low-power-consumption differential transmission chip

Abstract

The invention discloses a direct connection type testing device for a low-power-consumption differential transmission chip. The direct connection type testing device comprises an insert side interface, a testing system side interface, a difference solution chip group and a clock circuit. The insert side interface is directly in one-to-one connection and in two-way communication with the testing system side interface through parallel wiring. The difference solution chip group is in one-to-one connection and in one-way communication with the insert side interface through differential wiring, and is in one-to-one connection and in one-way communication with the testing system side interface through parallel wiring. The clock circuit is connected with the difference solution chip group. The direct connection type testing device has the advantages that the device is simple in structure and compact in wiring; mature chips and electronic components are adopted, and low purchase cost and high portability are achieved.

Description

technical field [0001] The invention relates to the field of circuit testing, in particular to a through testing device for low power consumption differential transmission chips. Background technique [0002] Electronic devices widely used in the industrial field are becoming more automated and intelligent, but due to the large number of low-power differential transmission chips, such as DS90CR285 and DS90CR286 chips, it is difficult to locate these electronic devices when there is a transmission failure If the fault point, especially the short circuit of the fine-pitch pins, cannot be found by naked eyes, it can only be solved by replacing a new chip, which will increase the debugging cost and reduce the reliability of the circuit board. [0003] In such cases, it is important to be able to accurately test low-power differential transmission chips. However, most existing devices for testing differential transmission rely on the entire system. By designing FPGA test logic, ...

AI Technical Summary

Problems solved by technology

However, most existing devices for testing differential transmission rely on the entire system. By designing FPGA test logic, connecting corresponding chips one by one through LVDS (Low Voltage Differential Signaling) cables, and then checking chip failures with an oscilloscope, this This method is not only time-consuming and labor-intensive, but also has a very narrow scope of use

In addition, with the development of equipment and electronic technology, the types of interfaces are constantly being upgraded and improved, so the method of simply designing FPGA test logic cannot well solve the general problem of low-power differential transmission chip testing

Finally, the complex wiring interface and hardware wiring mode will also make it difficult to develop test programs, which will affect the use of

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