Preparation method of thin steel wire longitudinal sectional electronic microscopic sample

A technology of transmission electron microscope and thin steel wire, which is applied in the field of preparation of longitudinal section samples of thin steel wire transmission electron microscope, can solve the problems of difficult fine operation, affecting the reliability of analysis results, amorphous structure, etc., and achieve high sample preparation success rate, Low cost, effect of increasing surface area

Active Publication Date: 2015-07-22
INST OF RES OF IRON & STEEL JIANGSU PROVINCE
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Problems solved by technology

However, this method is also difficult to finely operate, and long-term ion thinning will cause the matrix to form an amorphous structure during the bombardment of argon ions, which will affect the reliability of the analysis results.

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  • Preparation method of thin steel wire longitudinal sectional electronic microscopic sample
  • Preparation method of thin steel wire longitudinal sectional electronic microscopic sample

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with embodiment, and the schematic diagram that the sample is equidistantly tiled in the bottom flat mold is as follows figure 1 shown, but the examples should not be construed as limiting the invention.

[0021] (1) The sample is a drawn 82B high-carbon steel fine steel wire with a diameter of 0.8 mm and a structure of sorbite. The sample is cut into 5 initial samples with a length of 5-10 mm by a vise.

[0022] (2) Use the glued paper on the back of the waste sandpaper as the material, and cut it into figure 1 The open mold shown is 10mm x 10mm x 5mm in size, make sure the bottom of the mold is flat. Mix the cold mounting resin and curing agent at a ratio of 7:1 and stir slowly. The stirring speed should be such that no air bubbles are generated in the liquid. Take about 0.5mL and inject it into the mold. Spread on the bottom of the mold, the distance between each initial sample should be controlle...

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Abstract

The invention relates to a preparation method of a thin steel wire longitudinal sectional electronic microscopic sample. The method comprises the following processing steps: (1) cutting the sample into an initial sample with the length of 5-10 mm; (2) injecting curing glue into a mold, laying the initial sample horizontally at the bottom of the mold, and heating to enable the initial sample to be cured; (3) separating the cured sample from the mold, grinding the sample till the sample is 1 / 2 of the diameter of the steel wire, grinding the sample when the sample is turned until the thickness is 85-100 microns, using a puncher to punch a disc with the diameter of 3 mm, and ensuring that only one thin steel wire is positioned in the center of the disc; (4) uniformly coating the curing glue position of the disc surface with black grease, and utilizing a twin-jet to thin the disc, so as to obtain the sample suitable for observation under the transmission electron microscope. The preparation method can be used for the thin steel wire with the diameter from 0.1 mm to 3 mm, particularly for the thin steel wire with the diameter less than 1 mm, is simple in process, low in cost, high in operability and high in success rate of sample preparation, and successfully solves the problem that the thin steel wire longitudinal sectional electronic microscopic sample is difficult to prepare.

Description

technical field [0001] The invention belongs to the technical field of material transmission electron microscope sample preparation, and relates to a preparation method of a thin steel wire transmission electron microscope longitudinal section sample, in particular to a preparation method of a transmission electron microscope longitudinal section sample of a fine steel wire with large axial deformation and a diameter ranging from 0.1 mm to 3 mm. Background technique [0002] To use transmission electron microscopy to analyze the microstructure and other structures of iron and steel materials, it is necessary to prepare electron microscopy samples of moderate size and thickness. The microstructure of the steel wire after being drawn with a large amount of deformation changes greatly, but the macroscopic diameter is generally less than 3mm. The longitudinal section sample reflects the structural evolution of the material during the drawing process, but it is often very difficu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28
Inventor 张珂金传伟洪慧敏董登超
Owner INST OF RES OF IRON & STEEL JIANGSU PROVINCE
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