Dual-port static random access memory unit of half-refresh mechanism
A memory unit, static random technology, applied in the direction of static memory, digital memory information, information storage, etc., can solve the problems of large number of transistors, low density of memory cells, and reduced performance of transistors, so as to reduce the number of refreshes, increase the density of cells, cost reduction effect
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Embodiment 1
[0032] see figure 2, the present invention provides a dual-port SRAM unit with a half-refresh mechanism, the dual-port SRAM unit with a half-refresh mechanism at least includes: a monostable latch 10 and a monostable latch connected to the monostable latch 10 transmission gates; where,
[0033] The monostable latch 10 includes a pull-up transistor and a pull-down transistor. As an example, the pull-up transistor is a PMOS transistor, and the pull-down transistor is an NMOS transistor; the pull-up transistor is marked as PU, and the pull-down transistor is marked as PD.
[0034] The transmission gate is controlled by the first word line WL11, the second word line WL12, the third word line WL21 and the fourth word line WL22, and the transmission gate includes a first acquisition transistor, a second acquisition transistor, a third acquisition transistor and Fourth get the tube. As an example, the first acquisition tube, the second acquisition tube, the third acquisition tube...
Embodiment 2
[0049] This embodiment also provides a dual-port SRAM unit with a half-refresh mechanism, such as image 3 As shown, the dual-port SRAM unit of the half-refresh mechanism at least includes: a monostable latch 10 and a transmission gate connected to the monostable latch 10; wherein,
[0050] The monostable latch 10 includes a pull-up transistor and a pull-down transistor. As an example, the pull-up transistor is a PMOS transistor, and the pull-down transistor is an NMOS transistor; the pull-up transistor is marked as PU, and the pull-down transistor is marked as PD.
[0051] The transmission gate is controlled by the first word line WL11, the second word line WL12, the third word line WL21 and the fourth word line WL22, and the transmission gate includes a first acquisition transistor, a second acquisition transistor, a third acquisition transistor and Fourth get the tube. As an example, the first acquisition tube, the second acquisition tube, the third acquisition tube, and ...
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