High-voltage spike pulse generating circuit
A technology for generating circuits and narrow pulses, applied in pulse train generators, etc., can solve problems such as inability to effectively turn on NMOS transistors
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no. 1 example
[0043] Circuit of the first embodiment
[0044] see image 3 ,Such as image 3 Shown is the circuit of the first embodiment of the high-voltage narrow pulse generating circuit of the invention, the high-voltage narrow pulse generating circuit at least includes a narrow pulse signal generating module 1, a double voltage narrow pulse signal generating module 2 and a high-voltage narrow pulse signal conversion module 3; the narrow pulse The signal generating module is used to generate the first negative narrow pulse signal, the second negative narrow pulse signal and the positive narrow pulse signal, the high level of the positive narrow pulse signal is equal to VCC, the low level is equal to Vgnd, the first negative narrow pulse signal and the second The high level of the negative narrow pulse signal is equal to VCC, and the low level is equal to Vgnd, where VCC is the power supply voltage and Vgnd is the ground voltage;
[0045] The double voltage narrow pulse signal generati...
no. 2 example
[0055] Second embodiment circuit
[0056] Such as Figure 5 It is the circuit of the second embodiment of the present invention. On the basis of the circuit of the first embodiment, the circuit of this embodiment uses other adjustable delay transmission lines to replace the inverters INV1, INV2, INV3, and INV4. After such improvement, the pulse width of the high voltage narrow pulse signal generated by the circuit of the second embodiment is adjustable.
[0057] The narrow pulse signal generating module of this embodiment includes an adjustable delay transmission circuit, a fifth inverter, a sixth inverter, a seventh inverter and a NAND gate;
[0058] The output of the adjustable delay transfer circuit is connected to the input of the fifth inverter; the external clock signal CLKIN is connected to the input end of the adjustable delay transfer circuit and an input end of the NAND gate at the same time; the output end of the fifth inverter is connected to The other input ter...
no. 3 example
[0060] The circuit of the third embodiment
[0061] Such as Image 6 It is the circuit of the third embodiment of the present invention. The circuit of this embodiment is based on the circuit of the first embodiment, and another NMOS transistor, that is, the third transistor N3 is connected in series above the fourth transistor N4. In the circuit of the first embodiment, when the high-voltage narrow pulse CKOUT outputs a high-voltage signal twice the power supply voltage, the drain-source voltage and the drain-gate voltage of the fourth transistor N4 reach 2VCC, such a high inter-electrode voltage It will exceed the breakdown failure of the fourth transistor N4. Image 6Connecting the third transistor N3 in series above the fourth transistor N4 solves this problem. The gate of the third transistor N3 is connected to VCC, the source is connected to the drain of the fourth transistor N4, and the drain is connected to the drain of P1 to output a high voltage narrow pulse signa...
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