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Non-principle test device for general digital plug-ins and test method thereof

A test device and digital technology, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problem of lack of fault location of components, etc., achieve the effect of improving fault detection rate, reducing technical requirements, and improving fault isolation rate

Active Publication Date: 2015-09-16
CHINA ELECTRONIC TECH GRP CORP NO 38 RES INST
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  • Application Information

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Problems solved by technology

However, in order to meet the increasingly stringent quality requirements of users and the needs of on-site use of equipment, the construction of testing capabilities has to be strengthened
At present, for the test of the digital plug-in of the radar system, it is necessary to build a complete set of test system, and the function of the digital plug-in to be tested is determined indirectly by the overall working principle of the system, and there is a lack of fault location for the components on the digital plug-in. And the location of welding faults such as short circuit and open circuit

Method used

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  • Non-principle test device for general digital plug-ins and test method thereof

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Embodiment Construction

[0021] A non-principle test device for a general digital plug-in, including a test control computer 4 arranged in an integrated test cabinet 1, a function test extension 3 and a boundary scan test extension 2, and the power input ends of the three are connected to the 220V city through a power line. Electricity, the test control computer 4 is connected with the boundary scan test extension 2 through a USB cable, the test control computer 4 is connected with the function test extension 3 through a network cable, the test control computer 4 communicates with the boundary scan test extension 2 two-way, the test control computer 4 and the function test Extension 3 two-way communication, such as figure 1 shown.

[0022] Such as figure 2 As shown, the boundary scan test extension 2 includes a first switching power supply, its power input terminal is connected to 220V mains, and its power output terminal is connected to the input terminal of the boundary scan test backplane 2a thro...

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Abstract

The invention relates to a non-principle test device for general digital plug-ins, comprising a test control computer, a function test branch computer and a boundary scanning test branch computer which are arranged in an integrated test cabinet. The power input ends of the test control computer, the function test branch computer and the boundary scanning test branch computer are connected with a 220 mains supply through power lines. The test control computer is connected with the boundary scanning test branch computer through a USB cable, and the test control computer is connected with the function test branch computer through a network cable. The test control computer and the boundary scanning test branch computer communicate in a two-way mode, and the test control computer and the function test branch computer communicate in a two-way mode. The invention further discloses a test method of the non-principle test device for general digital plug-ins. The fault detection rate and fault isolation rate of digital plug-in boards are improved, the technical requirement for maintenance technicians is lowered, and the efficiency of digital plug-in test and repair is improved. The non-principle test device can assist in testing and debugging digital plug-ins in radar products, and especially, a testing and debugging platform is provided for separate plug-ins unable to build a whole system.

Description

technical field [0001] The invention relates to the technical field of automatic testing of digital circuit boards, in particular to a non-principle testing device for a universal digital plug-in and a testing method thereof. Background technique [0002] In the industrial field, while electronic equipment becomes more automated and intelligent, the design becomes more complex. Due to the extensive use of multi-layer high-density PCB boards and BGA packaged devices, it becomes extremely difficult to test circuit boards, especially Embodied on the digital plug-in of the radar system. However, in order to meet the increasingly stringent quality requirements of users and the needs of on-site use of equipment, the construction of testing capabilities has to be strengthened. At present, for the test of the digital plug-in of the radar system, it is necessary to build a complete set of test system, and the function of the digital plug-in to be tested is determined indirectly by t...

Claims

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Application Information

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IPC IPC(8): G01R31/02G01S7/40
Inventor 方云沈光正曹俊锋李正东王凤驰
Owner CHINA ELECTRONIC TECH GRP CORP NO 38 RES INST
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