On-chip power source noise peak value measurement system suitable for integrated circuit chip and measurement method of measurement system

Abstract

The invention discloses an on-chip power source noise peak value measurement system suitable for an integrated circuit chip and a measurement method. According to the power source noise peak value measurement system, digital signatures can be generated through resistor voltage division, inverter amplification and trigger sampling, so that power source noise peak values at various regions on a power source network on the integrated circuit chip can be measured in real time; and an adaptive control module is used in cooperation, so that adjustment processing can be performed on the measured peak values, and therefore, influence of power source noises on the performance of the integrated circuit chip can be decreased. The power source noise peak value measurement system of the invention has the advantages of high measuring accuracy and little influence on the chip. The power source noise peak value measurement system can be independently used for monitoring or testing the chip so as to reduce the interference of the power source noises to the chip.

Description

technical field [0001] The invention relates to a system for measuring power supply noise, more precisely, it is a measurement system suitable for on-chip real-time detection of power supply noise peak value on an integrated circuit chip. Background technique [0002] An integrated circuit (integrated circuit) is a tiny electronic device or component. Using a certain process, the transistors required in a circuit (the transistors are the main devices in the gate circuit), resistors, capacitors, inductors and other components and wiring are interconnected together to make a small or several small semiconductor wafers Or on a dielectric substrate, and then packaged in a package to become a microstructure with the required circuit functions; all the components have been structurally integrated, making electronic components towards miniaturization, low power consumption, intelligence and high A big step forward in terms of reliability. According to their different functions an...

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Problems solved by technology

[0011] After searching the existing technical literature, it was found that Z.Abuhamdeh, etc. published "Separating temperature effects from ring-oscillator rdading to measure true air-droponachip (removing the influence of temperature on the ring oscillator to detect on-chip IR-Drop noise)" at the IEEE International Test Conference (International Test Conference) in 2007. A method of detecting power supply noise by detecting the frequency change of the ring oscillator is proposed, but this method can only give the average power supply noise over a period of time, and does not involve the peak value of the power supply noise

In 2005, T.Okumoto and others published "Abuilt-intechniqueforprobingpower-supplynoisedistributionwithinlarge-scaledigitalintegratedcircuits (a technology built into large-scale integrated circuits for detecting power supply noise distribution)" on the IEEE Journal of Solid-State Circuits (Journal of Solid-State Circuits), and proposed the A method of using AD sampling method to obtain the instantaneous noise of the power supply, usually the sampling frequency should be several times the system clock frequency, which will cause a large power consumption, and it is difficult to generate such a high frequency on the chip

[0012] Although the above literature uses an on-chip measurement system, the measurement accuracy of the power supply noise peak is low, the power consumption is large during operation, and the measurement rate is slow

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