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Binary phase shifting pattern based three-dimensional measurement method

A technology for 3D measurement and phase measurement profile, applied in the field of 3D measurement, it can solve the problems of increased system calibration complexity, inability to use conventional calibration methods, and reduced dynamic range of projection brightness. The effect of the signal-to-noise ratio

Active Publication Date: 2015-12-16
SICHUAN UNIV
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AI Technical Summary

Problems solved by technology

However, the existing defocus measurement method based on a binary pattern has the following disadvantages due to the need to defocus the projection device: 1) The dynamic range of the projection brightness is reduced, resulting in a decrease in the signal-to-noise ratio of the captured image; Calibration method, the complexity of system calibration increases

Method used

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  • Binary phase shifting pattern based three-dimensional measurement method

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Embodiment Construction

[0009] The device used has a CASIOXJ-M140 projector, and the cache frame size of the projector is pixels, the gray quantization level is 8bit; 1 ProsilicaGC650 industrial camera, the resolution is Pixels, the grayscale quantization level is 8bit. 1 computer with Corei33530 CPU and 4GB memory, the computer controls the structured light projection and shooting process. attached figure 1 It is a working flow chart of the three-dimensional measurement method based on the binary phase shift pattern in this embodiment. The specific implementation steps of this example are as follows:

[0010] (1) Adjust the focus of the camera and projector to make them focus accurately.

[0011] (2) Calibrate the camera and projector, and obtain the size of the camera and projector as The projection matrix of , .

[0012] (3) Generate a binary phase shift pattern. Binary phase shift patterns are generated from sinusoidal phase shift patterns. The sinusoidal phase shift pattern can be...

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Abstract

The invention discloses a binary phase shifting pattern based three-dimensional measurement method, which is characterized in that focused projection equipment and a camera shooting device are utilized, a plurality of groups of binary pattern sequences coded by spatial square waves are projected to a measured objected by using the projection equipment, each group of patterns is provided with a specific spatial frequency, the spatial frequency of one of the groups of patterns is 1, adjacent patterns in each group of patterns have a fixed phase shifting amount therebetween, the total phase shifting amount is a cycle, corresponding pattern sequences are recorded by using the camera shooting device, a phase calculation formula of phase measuring profilometry is applied to image groups with different frequencies respectively so as to acquire a fundamental frequency phase and a plurality of high frequency truncation phases, an absolute phase is acquired according to a temporal phase unwrapping method, and three-dimensional coordinates of the measured object are determined according to the phases and system calibration parameters. The method disclosed by the invention can be applied to high-speed and high-precision three-dimensional measurement. The binary phase shifting pattern based three-dimensional measurement method has the advantages of ability of being free of nonlinear correction, high scanning speed, simple system calibration, and ability of accurately measuring scenes with great depth variations.

Description

technical field [0001] The invention relates to optical three-dimensional sensing technology, in particular to three-dimensional measurement on the surface of a target object by projecting a binary coded pattern. Background technique [0002] Currently, structured light measurement technology is the mainstream technology for high-precision 3D reconstruction. Among them, Phase Measuring Profilometry (PMP for short) is a classic structured light three-dimensional measurement method, which has the advantages of high measurement accuracy and insensitivity to interference factors such as ambient light and the texture of the measured object. PMP uses a sinusoidal structured light pattern sequence with phase shift, uses the captured image sequence to calculate the phase, and obtains the three-dimensional coordinates of the surface of the measured object through the phase information. However, PMP has the following disadvantages. First, since PMP uses a sinusoidal grayscale pattern...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 刘凯龙云飞吴炜杨晓敏
Owner SICHUAN UNIV
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