An automatic test device for the electronic control characteristics of a microring chip

Abstract

The invention belongs to the technical field of optical communication and provides an automatic test device for the electronic control characteristics of a microring chip. The device includes an automatic test and analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switching switch group. Under the control of the chip controller, the chip controller adjusts the working state of the microring chip to be tested, and then the scanning laser sends out a scanning light signal to the microring chip to be tested, and then the photoelectric conversion module converts the output optical signal into an electrical signal, and then sends it to the automatic test analysis The platform performs data processing to obtain the electronic control characteristics of the micro-ring chip. The invention can automatically and quickly measure the relationship curve of the resonant wavelength and output light power of the microring chip with the intensity of the control signal, so as to quickly determine the electrical control characteristics of the microring chip. Compared with manual debugging, the test time is greatly reduced and the test efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of optical communication, and in particular relates to an automatic test device for the electric control characteristics of a microring chip. Background technique [0002] With the advancement of informatization, the amount of information that people need to transmit is increasing day by day compared to the past. How to transmit information efficiently and at a high speed has become one of the hotspots of people's research. As the carrier of information, light has played a huge role in the field of optical fiber communication, making the optical fiber communication network continue to develop in the direction of higher speed, larger bandwidth, and lower power consumption. Network node equipment is more dependent on the commercialization of photonic integrated chips. [0003] As the basic structure of many photonic integrated chips, the microring resonator can realize functions such as wavelength division mul...

AI Technical Summary

Problems solved by technology

It is necessary to measure the electrical control characteristics of the microring chip in order to determine the optimal driving voltage or current of the functional chip; however, due to some limiting factors such as the design error of the waveguide structure and the imperfect chip processing technology, the actual microring chip The performance of the micro-ring is relatively random, and the initial working state is also uncertain, that is, the electronic control characteristics of each micro-ring unit are not the same

At present, people use manual debugging to obtain the electronic control information of some simple microring chips, but for chips composed of a large number of microrings, such as optical switch chips based on microring arrays, manual debugging will become difficult. Helpless, because the micro-ring is easily affected by the external environment. In this case, a slight change in the state of the previously adjusted micro-ring may affect the functional state of the currently adjusted micro-ring, or even fail to achieve the goal.

Therefore, it is difficult to obtain a sufficiently accurate electronic control characteristic curve of the micro-ring chip by manual methods, and it takes a long time and low efficiency to debug to the best working state

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