Novel Czochralski silicon single crystal doping method with resistivity control function
A technology of Czochralski silicon single crystal and resistance control, which is applied in the direction of single crystal growth, single crystal growth, chemical instruments and methods, etc., can solve problems such as short service life and hidden dangers of single crystal quality, and reduce the cost of crystal pulling and save Material or equipment, the effect of controllable resistivity
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[0024] Process requirements: preparation target resistivity ρ 目标 = 50Ω.cm single crystal silicon, the selected dopant is a single crystal with a resistivity value of 0.0063Ω.cm to make granular phosphorus alloy, and the mass of the dopant is 0.224g.
[0025] (1) Put the prepared raw materials into the single crystal furnace for melting. After the polycrystalline material is melted, adjust the crucible rotation to the normal crystal pulling crucible rotation, adjust the temperature to 1200sp, and keep the temperature stable. At this time, the process in the furnace The conditions are: power (KW) = 35KW; crucible speed (CR) = 1rpm; furnace chamber pressure (FT) = 16torr; stabilization time (hours): 0.5h;
[0026] (2) Pull the silicon single crystal test sample and measure its resistivity, compare the resistivity test value of the silicon single crystal test sample with the silicon single crystal target resistivity value, calculate the test resistivity test value of the test samp...
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