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Photoelectric near electric field scanner

A near-field scanning device, an optoelectronic technology, applied in the direction of electromagnetic field characteristics, etc., can solve the problems of complicated observation recording and data analysis, inflexible control methods, spatial electromagnetic interference, etc., and achieve vivid and variable resolution of three-dimensional field strength data. The effect of shortening the rate and avoiding damage

Active Publication Date: 2015-12-30
HEBEI UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a photoelectric electric field near-field scanner, which is a three-dimensional photoelectric electric field near-field scanning device equipped with upper and lower two optical fiber crystal probes, which overcomes the electric field detection system itself in the prior art The introduction of space electromagnetic interference, complex observation records and data analysis, vibration generated during the movement, inflexible control methods and low measurement accuracy

Method used

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  • Photoelectric near electric field scanner
  • Photoelectric near electric field scanner

Examples

Experimental program
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Effect test

Embodiment

[0035] The photoelectric electric field near-field scanner of this embodiment according to figure 1 , figure 2 and image 3 The assembly structure of the shown embodiment includes an electric field near-field scanning device 12, a power supply 1, a controller 2, a drive module 3, three stepper motors 4, a three-way position sensor 5, a signal processing circuit 6, and a 485 bus communication module 7, Host computer 8, semiconductor laser 9 and optical circuit 10; the input voltage of power supply 1 is AC 220 volts, and the output of power supply 1 is provided with three circuits of DC 24V3A, DC positive 5V2A and DC negative 5V2A, among which power supply 1 outputs DC 24V3A to the drive module 3 and three stepper motors 4 supply power, power supply 1 outputs DC positive 5V2A and DC negative 5V2A to supply power to op amp uA741, power supply 1 outputs 5V2A to supply power to controller 2, three-way position sensor 5, semiconductor laser 9 and signal processing circuit 6 , thr...

Embodiment 2

[0046] In the photoelectric electric field near-field scanner of the present embodiment, except that the distance between the two optical fiber crystal probes 11 is 1 cm up and down, the adjustable range of the upper and lower probe adjustment arms 20 with a scale is 1 cm, and the fixed frame of the circuit board to be tested is 1 cm. 14 can fix the circuit board 13 to be tested with a width of 1 cm, and the rail movement range of the X-axis guide rail 15, the Y-axis guide rail 16 and the Z-axis guide rail 17 is 1 cm, and the others are the same as in Embodiment 1.

Embodiment 3

[0048] In the photoelectric electric field near-field scanner of the present embodiment, except that the distance between the two fiber crystal probes 11 is 50cm up and down, the adjustable range of the upper and lower probe adjustment arms 20 with a scale is 50cm, and the fixed frame of the circuit board to be tested is 50cm. 14 can fix the circuit board 13 to be tested with a width of 50cm, and the rail movement range of the X-axis guide rail 15, the Y-axis guide rail 16 and the Z-axis guide rail 17 is 60cm, and the others are the same as in Embodiment 1.

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Abstract

The invention provides a photoelectric near electric field scanner, and relates to a system used for measuring magnetic variable and electrical variable, in particular to a three-dimensional photoelectric near electric field scanning device equipped with an upper optical fiber crystal probe and a lower optical fiber crystal probe. The photoelectric near electric field scanner comprises the near electric field scanning device, a power supply, a controller, a drive module, three stepping motors, three position sensors, a signal processing circuit, a 485 bus communication module, a host computer, a semiconductor laser and an optical loop, and can be used for scanning the near field intensities of the front and back side electric fields of a circuit board to be measured simultaneously, so as to avoid secondary interference and radiation on a component to be measured during scanning, and overcome the defects that in the prior art, space electromagnetic interference introduction, observation, recording and data analysis of an electric field detect system are complex, vibration generates during a moving process, the control mode is not flexible enough, and the measuring accuracy is low.

Description

technical field [0001] The technical proposal of the invention relates to a system for measuring magnetic variables and electric variables, specifically a photoelectric electric field near-field scanner. Background technique [0002] The electromagnetic compatibility of the circuit board is a link that cannot be ignored after the development of electronic technology to the high-speed era. The various electromagnetic radiation generated by the circuit board in operation will have a certain degree of influence on the surrounding electronic components and circuits. In the selection of components and the circuit board In the design process, electromagnetic compatibility design is a very important step, and the test and evaluation of electromagnetic radiation of circuit boards requires professional electromagnetic field strength testing equipment to complete. At present, the relatively mature technology in the world is to use probes made of micro-antennas or detection boards comp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08
Inventor 李尔平宋涛王蒙军
Owner HEBEI UNIV OF TECH
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