A continuous-time difference-integration modulator with rail-to-rail input

Abstract

The invention discloses a rail-to-rail input continuous time difference integral modulator, which comprises an integrating circuit, a quantification circuit and a sampling circuit, wherein the integrating circuit is used for realizing subtraction and integration of input voltage and feedback voltage, the quantification circuit is used for realizing quantification for output of the integrating circuit, and the sampling circuit is used for realizing sampling for the quantification circuit. The integrating circuit is realized based on a phase inverter structure and an RC integrator structure, the quantification circuit is realized based on the phase inverter structure, and the sampling circuit is realized based on a delay flip-flop of a true single phase clock structure. Compared with the prior art, the rail-to-rail input continuous time difference integral modulator, which is simple in structure and easy to migrate, is realized based on the phase inverter structure and the DFF (delay flip-flop) of the TSPC (True Single Phase Clock) structure and by being combined with resistors and a capacitor, is applicable to carrying out monitoring on low-frequency analog of the whole power voltage range, reduces the area, reduces the power consumption, and improves the integration level, thereby reducing the production cost, and prolonging the standby time.

Description

technical field [0001] The invention relates to the technical field of digital-to-analog converters, in particular to a rail-to-rail input continuous time differential integral modulator. Background technique [0002] In integrated circuits, it is often necessary to detect various DC and low-frequency voltage and current parameters in order to understand the working state of the chip, so as to make appropriate adjustments to make the chip work in the best state. For example, the temperature change is generally slow, but it has a great influence on the working performance of the circuit. At this time, the on-chip temperature sensor can output voltage to indicate temperature changes; the output voltage of the temperature sensor can be converted to the digital domain by means of ADC (analog-to-digital converter), and the operating parameters of each circuit can be dynamically adjusted. In recent years, the analog-to-digital converter based on differential integral modulation (...

AI Technical Summary

Problems solved by technology

[0003] The circuit structure of the existing differential integral modulation analog-to-digital converter is often too complicated, and when used in applications such as temperature monitoring, the input range is narrow, the area is large, and the power consumption is high, so the production cost is increased and the standby time is shortened.

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