Multi-channel material optical nonlinearity measurement method

An optical nonlinear, multi-channel technology, applied in the direction of phase influence characteristics measurement, etc., to achieve the effect of convenient measurement method, saving measurement time and accurate test results

Inactive Publication Date: 2016-03-16
SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the above-mentioned measuring devices can only measure the optical nonlinearity of one material at a ...

Method used

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  • Multi-channel material optical nonlinearity measurement method

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Embodiment 1

[0027] Embodiment one: see attached figure 2 As shown, a multi-channel optical nonlinear measurement technology, the optical path consists of a phase object, a beam splitter, a convex lens, a mirror, a small hole, and a detector; the pulsed laser is focused on the reference sample and the sample to be measured.

[0028]The laser pulse 1 is divided into two beams by the beam splitter 2. The energy of the monitoring light is converged by the first lens 3 and then received by the first detector 4. The other beam passes through the 1 / 2 glass plate 5, the polarizer 6 and the phase object After 7, the second beam splitter 8 divides into two beams of light again, one beam of light is focused on the reference sample 10 by the lens 9, and then detected by the second detector 12 through the first small hole 11. The other beam of light is divided into two beams by the beam splitter 13, and one beam is reflected on the second convex lens 14, and then focused onto the sample 1 to be teste...

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Abstract

The present invention discloses application of a multi-channel optical nonlinearity measurement technology to measure the third-order nonlinear refraction coefficient of a medium. According to the present invention, with numerical simulation, a linear relationship is formed in the range of 0-0.65; in the experiment, the results of a sample to be measured and a standard sample can be directly measured, and by using the linear range, the third-order nonlinear refraction coefficients of a plurality of samples to be measured can be measured through the measuring, such that the complex fitting calculation required by the original single-4f system is avoided; and the experiment results verify that the method of the present invention is correct.

Description

technical field [0001] The invention relates to a technology capable of simultaneously measuring the optical nonlinearity of multiple materials. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, research on nonlinear photonic materials is becoming increasingly important. The realization of functions such as optical logic, optical storage, optical transistor, and optical switch mainly depends on the research progress of nonlinear photonics materials. The measurement technology of optical nonlinear parameters of medium is the key technology to study nonlinear optical materials. The study of optical nonlinear materials requires the help of various optical nonlinear measurement techniques. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, degenerate four-wave mixing, third harmonic method, ellipsometry, phase obje...

Claims

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Application Information

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IPC IPC(8): G01N21/41
Inventor 宋瑛林杨俊义
Owner SUZHOU MICRONANO LASER PHOTON TECH CO LTD
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