A device for real-time testing of nonlinear parameters of cmos image sensors

Abstract

A device for nonlinear parameter real-time testing of a CMOS image sensor belongs to the field of CMOS image sensor testing and solves the problem that an existing method for manual testing of a nonlinear parameter of the CMOS image sensor leads to low testing accuracy. An FPGA processing plate collects position information of a rotation mechanism and controls the rotation mechanism by a stepping motor controller; laser emitted by a laser device is collimated by a telescope, enters a reflecting mirror, is then reflected by the reflecting mirror and focused by a focus lens and finally enters the to-be-tested CMOS image sensor by a diaphragm; the to-be-tested CMOS image sensor sends a collected light spot image to the FPGA processing plate via a parallel bus; and the FPGA processing plate processes the collected light spot image in real time to obtain an NU value, and the NU value is compared with a set threshold value, so that whether the to-be-tested CMOS image sensor is qualified is determined. The device is used to detect the image sensor.

Description

technical field

[0001] The invention belongs to the field of CMOS image sensor testing. Background technique

[0002] In satellite optical communication, CMOS image sensor is the main component of the optical system. In order to realize the reliability and safety of its space application, it is very important for the screening test of CMOS image sensor chips, especially the testing and screening of its nonlinear parameters, which will directly affect the output image of CMOS image sensor chips The amplitude and quality of the signal will affect the acquisition and tracking accuracy of the satellite optical communication system to a certain extent.

[0003] The method usually used is manual testing to test the nonlinearity of the CMOS image sensor chip. The disadvantage is that the test accuracy of the manual method is difficult to guarantee, and it is also difficult to guarantee a comprehensive test of the full field of view of the CMOS image sensor chip. . Therefore, the...

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