General-purpose single-layer capacitor bare-chip fine-tuning test socket device

Abstract

The invention discloses a slight adjustment test seat device for a naked core of a universal single-layer capacitor. The slight adjustment test seat device comprises a Z-directional lifting mechanism and a rotary naked core test mechanism, wherein the rotary naked core test mechanism is arranged on the Z-directional lifting mechanism and connected with an external vacuum device. Therefore, with the slight adjustment test seat device for the naked core during the high-speed test process, the test positioning accuracy is improved by rotatably adjusting a test needle and the test position of the naked core, the test deviation caused by the positioning accuracy is reduced, and the influence on the separation test accuracy and the efficiency is also reduced.

Description

technical field [0001] The invention is used in the field of microwave ceramic capacitor manufacturing. Specifically, it is a general-purpose single-layer capacitor bare-chip fine-tuning test seat device, which is used in the sorting and testing system of small-sized general-purpose single-layer capacitor bare-chip testing robots, and for testing general-purpose single-layer capacitor bare-chip . It is not only suitable for the sorting and testing system of general-purpose single-layer capacitor bare-die testing robots, but also can be used for picking up bare-die chips such as diodes, triodes, and capacitors, especially for thin, fragile and easily damaged bare-die chips with high positioning accuracy Chip test. Background technique [0002] General-purpose single-layer capacitors are widely used in military and high-end civilian fields, such as radar, missile remote control, satellite communication, positioning, TV satellite receiver, wireless local area and other system...

AI Technical Summary

Problems solved by technology

[0002] General-purpose single-layer capacitors are widely used in military and high-end civilian fields, such as radar, missile remote control, satellite communication, positioning, TV satellite receiver, wireless local area and other systems. The size of the bare chip chip is from 0.254mm ×0.254mm×0.127mm to 2.29mm×2.29mm×0.254mm, the capacitor bare chip has the characteristics of small size, thin, brittle, gold-plated coating is easy to scratch, etc., and the test socket device is a general-purpose single-layer capacitor bare The important components on the sorting test system of the chip test robot directly affect the test results of the general-purpose single-layer capacitor bare chip chip, and also affect the product quality of the chip, causing quality problems such as scratches, damage, and chipping

At present, manufacturers usually use manual picking, pick it up with tweezers, place it on the test board, and hold the test pin in contact with the chip. During the contact test process, due to the different proficiency of workers, the different test forces used and the influence of human factors , the chip will be damaged to varying degrees or the contact position of the test pin will deviate from the center of the chip, which will cause test errors, affect the accuracy of the test data, and then affect the application effect

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