Device and method for measuring linear polarization sensitivity of remote sensing instrument

Abstract

The invention discloses a device and a method for measuring linear polarization sensitivity of a remote sensing instrument. The measurement device comprises a light source, a collimating lens, a first polarizer, a second polarizer, a photoelectric detector, a polarization-maintaining expanded beam lens and the remote sensing instrument. Linearly polarized light modulation is performed on a light beam by two poloarizers, so that the linear polarization sensitivity of the remote sensing instrument is detected. The measurement method comprises the steps: 1) polarized angles of the two polarizers are precisely calibrated; 2) the two polarizer is made to rotate, light intensity detection is performed by using the remote sensing instrument, and relative optical efficiency curve of the remote sensing instrument is calculated; 3) the polarized angle of the first polarizer is changed, step 2) is repeated to obtain a plurality of optical efficiency curves, and data is integrated to calculate linear polarization sensitivity. The advantages of the device and method provided by the invention comprises: the polarization state of the light is clear, the available formula is precisely described, depolarization process is not needed, a shortcoming of big linear polarization sensitivity error caused by poor depolarization effect is overcome, and the device and the method are suitable for precisely detecting the linear polarization sensitivity of the remote sensing instrument.

Description

technical field [0001] The invention relates to the technical field of polarization spectroscopy, in particular to a device and method for measuring the linear polarization sensitivity of a remote sensing instrument. Background technique [0002] Polarization sensitivity describes the sensitivity of the optical system of the instrument to the polarization state of the incident light, and it reflects: when the polarization state of the incident light changes, the intensity of the outgoing light from the system changes. When actually describing the polarization sensitivity characteristics of an optical system, linear polarization sensitivity (LPS) is often used to characterize the polarization sensitivity of the system, which is defined as: when a beam of completely linearly polarized light is incident into an optical system, the linearly polarized light In the process of rotating the polarization direction of 180 degrees, the maximum value and the minimum value of the outgoin...

AI Technical Summary

Problems solved by technology

However, in this scheme, the degree of polarization of the light source has a great influence, and it is generally difficult to obtain light with a perfect zero polarization degree, which brings great uncertainty to the measurement of the linear polarization sensitivity of the instrument, generally about 1%. absolute measurement error

In addition, for the measurement scheme using birefringence crystal depolarizer, there is also the problem of beam separation, which is not suitable for remote measurement optical path

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