Device and method for measuring linear polarization sensitivity of remote sensing instrument
A linear polarization and sensitivity technology, applied in the field of polarization spectroscopy, can solve the problems of measurement uncertainty of instrument linear polarization sensitivity, inapplicability of remote measurement optical path, beam separation and other problems, and achieve the effect of analyzing the source of measurement error and high measurement accuracy
Active Publication Date: 2016-07-13
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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However, in this scheme, the degree of polarization of the light source has a great influence, and it is generally difficult to obtain light with a perfect zero polarization degree, which brings great uncertainty to the measurement of the linear polarization sensitivity of the instrument, generally about 1%. absolute measurement error
In addition, for the measurement scheme using birefringence crystal depolarizer, there is also the problem of beam separation, which is not suitable for remote measurement optical path
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[0021] The specific implementation manner of the present invention will be described below according to examples.
[0022] like figure 1 As shown, the measuring device includes a light source 1 , a collimating lens group 2 , a first polarizer 3 , a second polarizer 4 , a photodetector 5 , a polarization maintaining beam expander 6 and a remote sensing instrument 7 . The light source 1 adopts OSRAM 12v75w halogen lamp, the corresponding power supply is a steady current power supply, the short-term instability of the light source is less than 0.1%, and the signal-to-noise ratio is greater than 1000:1; the collimator lens group 2 is an achromatic composed of fused silica and calcium fluoride lens Lens group with an achromatic range of 400-900nm; the first polarizer 3 and the second polarizer 4 are Glan-Taylor prisms made of calcite, which are respectively installed on the hollow shaft of the turntable controlled by the stepping motor. The rotation angle of the turntable The rep...
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The invention discloses a device and a method for measuring linear polarization sensitivity of a remote sensing instrument. The measurement device comprises a light source, a collimating lens, a first polarizer, a second polarizer, a photoelectric detector, a polarization-maintaining expanded beam lens and the remote sensing instrument. Linearly polarized light modulation is performed on a light beam by two poloarizers, so that the linear polarization sensitivity of the remote sensing instrument is detected. The measurement method comprises the steps: 1) polarized angles of the two polarizers are precisely calibrated; 2) the two polarizer is made to rotate, light intensity detection is performed by using the remote sensing instrument, and relative optical efficiency curve of the remote sensing instrument is calculated; 3) the polarized angle of the first polarizer is changed, step 2) is repeated to obtain a plurality of optical efficiency curves, and data is integrated to calculate linear polarization sensitivity. The advantages of the device and method provided by the invention comprises: the polarization state of the light is clear, the available formula is precisely described, depolarization process is not needed, a shortcoming of big linear polarization sensitivity error caused by poor depolarization effect is overcome, and the device and the method are suitable for precisely detecting the linear polarization sensitivity of the remote sensing instrument.
Description
technical field [0001] The invention relates to the technical field of polarization spectroscopy, in particular to a device and method for measuring the linear polarization sensitivity of a remote sensing instrument. Background technique [0002] Polarization sensitivity describes the sensitivity of the optical system of the instrument to the polarization state of the incident light, and it reflects: when the polarization state of the incident light changes, the intensity of the outgoing light from the system changes. When actually describing the polarization sensitivity characteristics of an optical system, linear polarization sensitivity (LPS) is often used to characterize the polarization sensitivity of the system, which is defined as: when a beam of completely linearly polarized light is incident into an optical system, the linearly polarized light In the process of rotating the polarization direction of 180 degrees, the maximum value and the minimum value of the outgoin...
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CPCG01M11/02
Inventor 蔡清元冯旗刘定权刘宝丽罗海瀚冯鑫周靖郑玉祥丛蕊刘保剑
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI