One-time programmable microcontroller chip based test circuit and test method

A technology for testing circuits and microcontrollers, applied in the field of integrated circuits, which can solve the problems of large OTP memory area, inability to modify, increase chip area, etc., to achieve the effects of easy testing, improved testing flexibility, and reduced port resources

Active Publication Date: 2016-10-05
SHANGHAI SINOMCU MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the one-time programmable characteristics of OTP memory, once the test program is written, it cannot be modified. To change some control signals generated by the test program, the chip can only be replaced, which is not flexible to use.
Secondly, because the area occupied by the OTP memory in the chip is relatively large, if there are many test programs on the chip, the required OTP storage space will increase, and the area of ​​the chip will be greatly increased accordingly.

Method used

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  • One-time programmable microcontroller chip based test circuit and test method
  • One-time programmable microcontroller chip based test circuit and test method
  • One-time programmable microcontroller chip based test circuit and test method

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Embodiment Construction

[0025] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0026] The object of the present invention is to provide a testability circuit and a test method of an OTP microcontroller chip with high test flexibility, small chip area, strong anti-interference, and user data security.

[0027] In order to achieve the above object, the invention discloses a testability circuit of an OTP type microcontroller chip. like figure 1 As shown, it includes: serial clock input port PSCK, used to input serial clock signal to the chip; serial data input port PSDI, used to input serial data signal to the chip; serial data output port PSDO, used for Output serial data signal from this chip; External clock input port CLK, is used for providing the master clock of normal operation to this chip; Test circuit 10, is used to receive external test instruction and test program to complete the test of chip; OTP memory 20, It...

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Abstract

The invention discloses a one-time programmable microcontroller chip based test circuit, which comprises an unlocking unit, a decoding unit and a testing unit, and is characterized in that the unlocking unit receives a level signal and a serial data signal, and the unlocking unit sends an unlocking signal when the level signal and the serial data signal satisfy a specific time sequence; the decoding unit is connected with the unlocking unit, and the decoding unit receives the serial data signal and a serial clock signal after receiving the unlocking signal and generates a test signal and a test clock signal; and the testing unit is connected with the decoding unit, and the testing unit receives the serial data signal and the test clock signal after receiving the test signal and sends test data in the serial data signal to a processor, wherein the test clock signal is enabled to act as a clock signal of the processor.

Description

technical field [0001] The invention relates to the field of integrated circuits, in particular to a method for testing an OTP type microcontroller chip in the field. Background technique [0002] OTP (One Time Programmable) one-time programmable memory, because of its cheap price, small area and reliable data storage, is widely used in 8-bit / 16-bit / 32-bit microcontroller chips to store user programs or data. When the chip leaves the factory, the content stored in the OTP is all 1, and the user can write some cells into data 0 as needed to achieve the purpose of "programming". The typical product of OTP is "bipolar fuse structure". If you want to rewrite some cells, you can pass a large enough current (high voltage programming) to these cells and maintain it for a certain period of time. The fuses related to these cells are It can be blown, so that the effect of writing some units as 1 is achieved. Since OTP data modification is realized through physical permanent changes,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 杨维张文荣陆健王成王鹏徐学良
Owner SHANGHAI SINOMCU MICROELECTRONICS
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