Active clamp flyback circuit and control method thereof
A flyback circuit and clamping circuit technology, applied in control/regulation systems, electrical components, and electrical variables to adjust, etc., can solve the problems of difficulty in optimizing light-load efficiency, low light-load efficiency, and large no-load power consumption, and achieve Flexible control scheme, reducing no-load power consumption, and the effect of reducing no-load power consumption
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Embodiment 1
[0029] Such as Figure 4 As shown, it is the circuit schematic diagram of the active clamping flyback circuit of the present invention, the circuit adds a clamping diode D2 on the basis of the traditional active clamping flyback circuit, and the cathode of the clamping diode is connected to the terminal of S2 At the drain terminal, the anode of the clamp diode is connected to the bus terminal, and the diode is connected in parallel with the clamp capacitor.
[0030] Such as Figure 5 As shown, it is the working waveform diagram of the active clamp flyback circuit of the present invention under full load. The specific working principle of the circuit is that at T0 time, the switch tube S1 is turned on, the input voltage is negatively demagnetized to the exciting inductor, and the exciting current After zero-crossing, it is positively excited, and the current flows from the voltage input terminal to the transformer and then flows through the switch tube S1. No current flows throu...
Embodiment 2
[0036] Such as Figure 10 As shown, it is the circuit schematic diagram of the specific embodiment 2 of the active clamping flyback circuit of the present invention. The difference between the active clamping flyback circuit of this embodiment and the first embodiment is that the The clamping diode was replaced with a TVS tube. Compared with the ordinary diode used in the first embodiment, the use of the TVS tube can not only realize the function of the ordinary diode to clamp the excitation inductance voltage, but also suppress the S1 drain voltage in a lower range, and use a smaller In this case, ensure that the drain-source voltage stress of S1 is within a safer range. Its working principle is the same as that in Embodiment 1, so it will not be repeated here.
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