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OLED device with short detection circuit using temperature measurement

A technology for detecting circuits and temperature sensors, which is applied in the direction of electric solid-state devices, circuits, electrical components, etc., and can solve problems such as OLED defects

Inactive Publication Date: 2016-11-30
OLEDWORKS GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, an OLED can be considered defective if the forward voltage falls below a pre-defined threshold for a nominally constant drive current

Method used

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  • OLED device with short detection circuit using temperature measurement
  • OLED device with short detection circuit using temperature measurement
  • OLED device with short detection circuit using temperature measurement

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0068] In the drawings, the same or corresponding reference numerals refer to the same or corresponding parts and / or elements.

[0069] figure 1 Results from experiments performed in order to evaluate the effects resulting from shorting occurring in the OLED 100 during operation are illustrated. OLED 100 comprises a substrate, here a glass substrate, on which several layers are deposited. These layers include: a transparent electrode layer, here an indium tin oxide (ITO) layer, which acts as the anode; a light-emitting layer, here formed by several functional layers for recombination of holes and electrons to emit the desired spectrum; A reflective electrode layer, which acts as a cathode; and a thin-film encapsulation encapsulating the light-emitting layer on the substrate (neither is shown in detail in the figure). By means of this layered structure, a light-emitting area 101 is realized, which in this example is 5×5 cm in size 2 . In this experiment, the OLED 100 was el...

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PUM

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Abstract

The present invention relates to an OLED device (51) comprising an OLED (52) and a short detection circuit (53) for detection a short in the OLED (52). The short detection circuit (53) comprise a temperature sensing unit (55) for sensing a first and a second temperature of the OLED (52) and a short detection unit (56) for detecting the short based on a difference between the first and the second temperature. Therewith, the short detection can be less sensitive with respect to production tolerances resp. OLED binning.

Description

technical field [0001] The present invention relates to an organic light emitting diode (OLED) device comprising an OLED and a short detection circuit for detecting a short in the OLED. Furthermore, the present invention relates to a corresponding short detection circuit and a corresponding short detection method for detecting a short in an OLED. Still additionally, the invention relates to a corresponding lighting system comprising an OLED device. Background technique [0002] OLEDs (in particular, large area OLEDs) tend to short due to small particles contaminating the OLED substrate and / or layers with imperfect cleaning and handling during production. Since in practice not all defects can be detected in fine production quality control, the occurrence of small shorts during operation may not always be avoided. [0003] The detection of such shorts in the light-emitting region of the OLED is important because they can lead to a significant increase in temperature at the d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H05B33/08H05B44/00
CPCH05B45/60Y02B20/30H05B47/105H10K50/844H10K50/841
Inventor D.亨特
Owner OLEDWORKS GMBH