Defect cutting device for capacitor-used metalized film

A metallized film and capacitor technology, applied in capacitors, capacitor manufacturing, circuits, etc., can solve the problems of poor surface smoothness of the film, stoppage of film continuous transmission, waste of production resources, etc., achieve significant practical value, ensure continuity, The effect of improving efficiency

Inactive Publication Date: 2016-12-21
铜陵市铜创电子科技有限公司
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is ideal if these two types of thickness measuring equipment can be used together, but the online thickness measuring equipment detection equipment is relatively complicated, and the non-contact detection is used, which is prone to large data fluctuations caused by poor surface smoothness of the film. Non-on-line thickness measurement equipment can provide contact measurement method, which effectively makes up for the deficiency of online thickness measurement
At present, after the on-line inspection equipment detects the defects of the capacitor film, most of them cut off the film through the film cutting device, resulting in a pause in the continuous conveying of the film. waste of

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect cutting device for capacitor-used metalized film
  • Defect cutting device for capacitor-used metalized film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] like figure 1 , figure 2 As shown, the present invention provides a defect cutting device for metallized films for capacitors, which includes a light-transmitting plate 20, a light-emitting device 31 is arranged under the light-transmitting plate 20, and a metallized film is laid on the light-transmitting plate 20. film 10, the light emitted by the light-emitting device 31 sequentially passes through the light-transmitting plate 20 and irradiates the back of the metallized film 10, and a laser cutting device is installed at a position behind the light-transmitting plate 20 on the stroke of the metallized film 10, The laser cutting device includes a support frame 40 on which a movable arm 41 is disposed, and a laser 42 is disposed on the movable arm 41 . This technical solution cuts the defects of the film through a laser cutting device. Because the movable arm 41 is flexible, it can carry the laser 42 to move quickly. Because there are multiple capacitor films to be c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a defect cutting device for a capacitor-used metalized film, which belongs to the technical field of capacitor detection devices. The device comprises a light transmitting plate; a light emitting device is arranged below the light transmitting plate; a metalized thin film is laid on the light transmitting plate; light emitted by the light emitting device sequentially passes through the light transmitting plate to irradiate on the back surface of the metalized thin film; the position, located behind the light transmitting plate, on the stroke of the metalized thin film is provided with a laser cutting device; the laser cutting device comprises a supporting frame; the supporting frame is provided with a movable arm; and a laser is arranged on the movable arm. According to the technical scheme of the invention, the laser cutting device carries out cutting processing on defects of the thin film, the laser can selectively cut off an area of the capacitor film electrode with the defect, the overall continuity of the metalized film is ensured, and the continuous production efficiency is improved.

Description

technical field [0001] The invention relates to a defect cutting device for metallized films for capacitors, belonging to the technical field of capacitor detection devices. Background technique [0002] At present, capacitors are widely used in the fields of power electronics, communication facilities and rail transportation. With the development of science and technology, capacitors have become indispensable electronic components to promote the upgrading of the above industries due to their good electrical performance and high reliability. Among them Due to its small size and high safety, film capacitors have greatly promoted the development of capacitor technology. In the prior art, the common manufacturing method of film capacitors is to overlap metal film and plastic films such as polyethylene, polypropylene, polystyrene or polycarbonate from both ends, and then wind it into a cylindrical metallized film electrode. Then it is placed in the capacitor case, injected with...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01G13/00
CPCH01G13/00
Inventor 高文明
Owner 铜陵市铜创电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products