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Super-resolution quantum interference measurement system based on parity detection strategy and super-resolution quantum interference measurement method thereof

A quantum interference and measurement system technology, which is applied in the direction of measuring devices, instruments, and optical devices, can solve the problem of low resolution of interferometers, achieve the effect of improving detection resolution, improving resolution, and realizing performance advantages

Inactive Publication Date: 2017-01-04
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to solve the shortcoming of low resolution of existing interferometers, and propose a super-resolution quantum interferometry system and method based on parity detection strategy

Method used

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  • Super-resolution quantum interference measurement system based on parity detection strategy and super-resolution quantum interference measurement method thereof
  • Super-resolution quantum interference measurement system based on parity detection strategy and super-resolution quantum interference measurement method thereof
  • Super-resolution quantum interference measurement system based on parity detection strategy and super-resolution quantum interference measurement method thereof

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specific Embodiment approach 1

[0023] Specific implementation mode one: combine figure 1 Illustrate this embodiment mode, a kind of super-resolution quantum interferometry system based on odd-even detection strategy, it is characterized in that it comprises: synchronous signal device (1), pulsed laser (2), odd-even detector (9), interferometer (10) ;

[0024] The parity detector (9) includes a photon number resolution counter (7) and a control and signal processing system (8);

[0025] The synchronous annunciator (1) generates two beams of synchronous signals, one beam of synchronous signals is transmitted to the pulsed laser (2), and the pulsed laser (2) is driven to generate pulsed lasers, and the pulsed lasers are passed through the interferometer (10) to generate two beams of pulsed lasers, and one of them is selected Any beam of pulsed laser light is transmitted to the photon number resolution counter (7), and the photon number resolution counter (7) detects the pulsed laser light; the detection resu...

specific Embodiment approach 2

[0028] Specific implementation mode two: combination figure 2 Describe this embodiment, the difference between this embodiment and specific embodiment one is that: the interferometer (10) includes a first non-polarizing beamsplitter prism (3), a first total reflection mirror (4), a second total reflection mirror ( 5) and the second non-polarizing beam splitter prism (6);

[0029] The synchronous annunciator (1) generates two beams of synchronous signals, one beam of synchronous signals is transmitted to the pulsed laser (2), and the pulsed laser (2) is driven to generate pulsed laser, and the pulsed laser is divided into two beams by the first non-polarizing beam splitter (3), One beam is reflected by the first total reflection mirror (4) and reaches the second non-polarization beam splitter (6), and the other beam is reflected by the second total reflection mirror (5) and reaches the second non-polarization beam splitter (6), and the two beams reach the second non-polarizati...

specific Embodiment approach 3

[0033]Embodiment 3: This embodiment differs from Embodiment 1 or Embodiment 2 in that: the interferometer is a Mach-Zehnder interferometer (MZI).

[0034] Other steps and parameters are the same as those in Embodiment 1 or Embodiment 2.

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Abstract

The invention provides a super-resolution quantum interference measurement system based on a parity detection strategy and a super-resolution quantum interference measurement method thereof, relates to the super-resolution quantum interference measurement system based on the parity detection strategy and the super-resolution quantum interference measurement method thereof, and aims at solving the disadvantages of low resolution of the existing interferometers. The system comprises a synchronous signal device (1), a pulse laser device (2), a parity detector (9) and an interferometer (10). The parity detector (9) comprises a photon number distinguishing counter (7) and a control and signal processing system (8). The synchronous signal device (1) generates two beams of synchronous signals, one beam of synchronous signals are transmitted to the pulse laser device (2) to generate pulse laser, two beams of pulse laser is generated through the interferometer, and any one of the two beams of pulse laser is selected to be transmitted to the photon number distinguishing counter (7) to detect pulse laser. The detection result is transmitted to the control and signal processing system (8) to perform data processing and display. The super-resolution quantum interference measurement system based on the parity detection strategy and the super-resolution quantum interference measurement method thereof is used for the field of quantum detection.

Description

technical field [0001] The invention relates to a super-resolution quantum interference measurement system and method based on an odd-even detection strategy. Background technique [0002] Interferometer is the most basic and most commonly used system in modern optical measurement technology. When two beams of coherent electromagnetic waves interfere, such as occurs in Young's double-slit interference experiment or a standard Mach-Zehnder (MZ) interferometer, an intensity that varies with the optical path difference between the two arms of the interferometer can be seen on the receiving screen As for the changing interference fringe pattern, the changing period of the pattern is determined by the wavelength λ of the electromagnetic field. Usually we call the change of the optical path difference (phase difference) that causes the interfering light intensity to change for one-half cycle as the standard resolution limit of the interferometer, that is, λ / 2π. From the perspect...

Claims

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Application Information

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IPC IPC(8): G01B9/02
CPCG01B9/02083
Inventor 张子静赵远岑龙柱苏建忠王峰
Owner HARBIN INST OF TECH
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