High-temperature micro-nano press mark test device and method in vacuum environment
A vacuum environment and testing device technology, applied in measuring devices, testing material hardness, instruments, etc., can solve problems such as inability to provide test pieces and indenters, measurement signal drift, and inability to guarantee the temperature difference between indenters and test pieces
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0085] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.
[0086] see figure 1 and figure 2 As shown, the high-temperature micro-nano indentation test device in a vacuum environment of the present invention is mainly composed of six parts: a frame, a Z-direction macro adjustment module, an indentation precision loading module, an indentation test module, a heating module and an eccentric point change mechanism. . The device is small in size and easy to integrate in the vacuum chamber system to prevent the oxidation of the indenter and the test piece, thereby increasing the test temperature. The main body of the device is fixed in the vacuum chamber system 49 through the marble base 1 . The Z-direction macro adjustment module is assembled on the marble substrate 5 . The indentation precision loading module is installed on the Z-direction macro adjustment module throug...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com