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High-temperature micro-nano press mark test device and method in vacuum environment

A vacuum environment and testing device technology, applied in measuring devices, testing material hardness, instruments, etc., can solve problems such as inability to provide test pieces and indenters, measurement signal drift, and inability to guarantee the temperature difference between indenters and test pieces

Pending Publication Date: 2017-02-15
JILIN UNIV
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0003] At present, most of the high-temperature indentation instruments at home and abroad provide the temperature field through the heating platform, but since the heating platform provides an open heating environment, and the heating method is contact heating, it is not only impossible to provide the test piece and indenter with An ultra-high temperature heating environment as high as 1600°C, and it is impossible to ensure that the temperature difference between the indenter and the test piece is small enough, so that once the two are in contact, there will be heat transfer, which will cause the two to expand and contract. Eventually, the measurement signals of displacement and force will drift, which will lead to inaccurate measurement data. It is necessary to check the experimental data later to eliminate the error caused by thermal temperature drift, because one of the difficulties of high temperature indentation experiment is One is to solve the temperature drift problem caused by the temperature difference between the indenter and the test piece, so the above problems need to be solved urgently

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Embodiment Construction

[0085] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.

[0086] see figure 1 and figure 2 As shown, the high-temperature micro-nano indentation test device in a vacuum environment of the present invention is mainly composed of six parts: a frame, a Z-direction macro adjustment module, an indentation precision loading module, an indentation test module, a heating module and an eccentric point change mechanism. . The device is small in size and easy to integrate in the vacuum chamber system to prevent the oxidation of the indenter and the test piece, thereby increasing the test temperature. The main body of the device is fixed in the vacuum chamber system 49 through the marble base 1 . The Z-direction macro adjustment module is assembled on the marble substrate 5 . The indentation precision loading module is installed on the Z-direction macro adjustment module throug...

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Abstract

The invention relates to a high-temperature micro-nano press mark test device and method in vacuum environment, and belongs to the field of mechanical and electronic integration precise instrument. The device can be used in vacuum environment; the oxidization caused by high-temperature environment on a press head and a test specimen can be prevented; the influence of air flowing on the test specimen heating is weakened; the stable heating temperature of the test specimen is ensured; further, the test analysis on the test specimen micro mechanical properties can be started; the characteristics parameters and the like of material hardness, elasticity modulus, creep properties and thermo-mechanical coupling effects are obtained so as to study the influence rule of variable-temperature and high-temperature environment on the material micro mechanical behaviors, deformation damage mechanisms and micro tissue structure evolution; the material and product design manufacturing, service prediction and reliability evaluation are guided. The structure of the device is compact; the measurement precision is high; the application range is wide; the wide application prospects are realized in the fields of material science, equipment manufacturing, ferrous metallurgy, national defense and military, aerospace and the like. According to the test method provided by the invention, the rich material micro mechanical property test theories and technical systems are combined.

Description

technical field [0001] The invention relates to a high-temperature micro-nano indentation testing device and method in a vacuum environment, belonging to the field of electromechanical integrated precision instruments. The test device integrates precision drive, temperature loading, and signal detection technology. It can be applied in a vacuum environment to prevent the oxidation of the indenter and the sample sample caused by the high temperature environment, and weaken the influence of the air flow on the heating effect of the tested sample. Ensure the stability of the heating temperature of the tested sample, and then carry out the test and analysis of the micro-mechanical properties of the test piece sample, and obtain the hardness, elastic modulus, creep characteristics and characteristic parameters of the force-thermal coupling effect of the material based on the micro-nano indentation test technology. To study the influence of temperature and high temperature environme...

Claims

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Application Information

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IPC IPC(8): G01N3/54
CPCG01N3/54G01N2203/0003G01N2203/0019G01N2203/0051G01N2203/0676G01N2203/0682G01N2203/0082G01N2203/008G01N2203/0208G01N2203/0226G01N2203/0617
Inventor 赵宏伟于淼任露泉洪坤乔元森刘航方岱宁裴永茂曲兆亮李莉佳吴迪孙兴栋苗淼周明星
Owner JILIN UNIV
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