Method and device for precisely measuring arrival time of jump edge

Abstract

The invention relates to a method and a device for precisely measuring arrival time of a jump edge. The method comprises the following steps of (1) calibration: providing multiple different standard arrival time signals, carrying out multi-stage time delay of one standard arrival time signal, subjecting signals to voltage collection and arrangement at standard specific times after each stage of time delay to obtain a feature voltage value group, obtaining feature voltage value groups of other standard arrival time signals, and forming a calibration table by multiple feature voltage value groups, multiple standard arrival times and time differences among front edges in a CLK period; (2) jump edge arrival time measurement: obtaining a to-be-detected feature voltage value group, finding a time difference between a to-be-detected arrival time and a front edge in a CLK period using the calibration table, and adding the time difference and the time of the front edge of the to-be-detected arrival time in the CLK period to obtain a to-be-detected jump edge arrival time. The measurement precision of the method is high, the measurement time interval is large, and the device structure is simple.

Description

technical field [0001] The invention relates to the field of time measurement, in particular to a method and device for accurately measuring the arrival time of a transition edge. Background technique [0002] Laser ranging is one of the applications of laser. After years of development, this technology has been successfully used in many important fields such as military affairs and aerospace. The basic principle is: the laser emits photoelectrons, the photoelectrons fly in the air, encounter obstacles and reflect back to the laser, and measure the flight time of photoelectrons in the air through the time interval measuring device inside the detector, so as to measure the distance between the laser and obstacles. In this method, the time interval measuring device plays a crucial role. [0003] At present, people generally measure the time accurately by passing the signal to be tested (single pulse signal) through a delay line. The rising edge of the signal to be tested repr...

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Problems solved by technology

[0004] 1. The accuracy of this measurement method depends on the delay time of the delay unit. The shorter the delay time of the delay unit, the higher the accuracy, but it is still unable to measure the time interval of PS (picosecond) level

[0005] 2. The time interval that can be measured by this measurement method depends on the total delay time of the entire delay line. At the same time, in order to pursue the maximum measurement time interval, the number of delay units must be increased, thereby increasing the area of ​​the chip, which cannot be applied to lasers In a detector device with a large time interval between the emission of photoelectrons and the acceptance of photoelectrons

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