Method and device for measuring arrival time of high-energy photons

A time-of-arrival and high-energy photon technology, applied in measurement devices, radiation measurement, X/γ/cosmic radiation measurement, etc., to achieve high time resolution

Active Publication Date: 2017-02-22
ZHONGPAI S&T SHENZHEN CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Due to the existence of this bottleneck, the theoretical optimal time resolution of a detector system comp...

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  • Method and device for measuring arrival time of high-energy photons
  • Method and device for measuring arrival time of high-energy photons
  • Method and device for measuring arrival time of high-energy photons

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Embodiment Construction

[0024] In the following description, numerous details are provided in order to provide a thorough understanding of the invention. However, it will be appreciated by those skilled in the art that the following description relates only to preferred embodiments of the invention and that the invention may be practiced without one or more of these details. In addition, in order to avoid confusion with the present invention, some technical features known in the art are not described.

[0025] In order to solve the above problems, the present invention proposes a method and device for measuring the arrival time of high-energy photons, which is used in a continuous crystal-based ultra-high time-resolution detector system. The scintillation crystal layer of a continuous crystal based detector system can consist of a single continuous crystal. For example, a 30 mm x 30 mm x 20 mm crystal can be used to directly form the scintillation crystal layer. By designing corresponding photosens...

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Abstract

The invention provides a method and a device for measuring arrival time of high-energy photons. The method includes acquiring relevant arrival time of visible photons detected by every sensor unit in a photoelectric sensor array and generated from reaction between the high-energy photons and scintillation crystals, wherein the scintillation crystals refer to continuous crystals, and the photoelectric sensor array comprises a plurality of sensor units coupled with the scintillation crystals; acquiring to-be-averaged time corresponding to each of at least part of sensor units selected in the photoelectric sensor array at least based on the relevant arrival time of the visible photons detected by every sensor unit in the photoelectric sensor array; averaging the to-be-averaged time corresponding to each of at least part of the sensor units so as to obtain the arrival time of the high-energy photons. The method and the device for measuring the arrival time of the high-energy photons have the advantage that through averaging the to-be-averaged time acquired by the sensor units, high time resolution can be obtained.

Description

technical field [0001] The invention relates to the field of photon measurement, in particular to a method and device for measuring the arrival time of high-energy photons. Background technique [0002] In the field of detection of high-energy photons (such as X-rays, gamma photons, etc.), the detector system generally consists of scintillation crystals, photoelectric sensors, and readout circuits. The positron emission imaging system is taken as an example for description below. In positron emission imaging systems, scintillation crystals, such as bismuth germanate (BGO), yttrium lutetium silicate (LYSO), lanthanum bromide (LaBr3), etc., can convert gamma photons into visible photon groups. Photosensors, such as photomultiplier tubes (PMTs), silicon photomultiplier tubes (SiPMs), avalanche photodiodes (APDs), etc., can convert light signals of visible photon groups into electrical signals. The readout circuit can obtain the energy of the gamma photon and the time when the...

Claims

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Application Information

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IPC IPC(8): G01T1/00H05G1/26
CPCG01T1/00G01T1/003H05G1/26
Inventor 龚政赵指向许剑锋翁凤花黄秋
Owner ZHONGPAI S&T SHENZHEN CO LTD
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