Transistor and system modeling methods based on artificial neural network
A technology of artificial neural network and modeling method, which is applied in the field of transistor and system modeling, and can solve problems such as increased complexity of formulas, inflexibility of different processes and materials, etc.
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[0046] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0047] The present invention provides a transistor modeling method based on artificial neural network, refer to figure 1 ,include:
[0048] Measure the value of the S parameter of the transistor at multiple temperatures and multiple static biases;
[0049] Determine the small-signal...
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